Sloman; David E.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Sloman; David E..The latest application filed is for "kerf contact to silicon redesign for defect isolation and analysis".
- Sloman; David E. - Poughkeepsie NY
| Patent | Date |
|---|---|
| Kerf contact to silicon redesign for defect isolation and analysis Grant 6,426,516 - Sloman July 30, 2 | 2002-07-30 |
| Kerf Contact To Silicon Redesign For Defect Isolation And Analysis App 20020063249 - SLOMAN, DAVID E. | 2002-05-30 |
| Titlable optical microscope stage Grant 5,337,178 - Kung , et al. August 9, 1 | 1994-08-09 |
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