loadpatents
Patent applications and USPTO patent grants for Sivaraman; Gangadharan.The latest application filed is for "methods for improving optical inspection and metrology image quality using chip design data".
Patent | Date |
---|---|
Methods For Improving Optical Inspection And Metrology Image Quality Using Chip Design Data App 20220270212 - Sah; Kaushik ;   et al. | 2022-08-25 |
Creating defect samples for array regions Grant 10,620,134 - Anantha , et al. | 2020-04-14 |
Creating Defect Samples for Array Regions App 20190346375 - Anantha; Vidyasagar ;   et al. | 2019-11-14 |
Sub-pixel alignment of inspection to design Grant 9,996,942 - Bhattacharyya , et al. June 12, 2 | 2018-06-12 |
Repeater detection Grant 9,766,187 - Chen , et al. September 19, 2 | 2017-09-19 |
Sub-Pixel Alignment of Inspection to Design App 20160275672 - Bhattacharyya; Santosh ;   et al. | 2016-09-22 |
Repeater Detection App 20160061745 - Chen; Hong ;   et al. | 2016-03-03 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.