SINO IC TECHNOLOGY CO., LTD.

Patent Applications and Registrations

Patent applications and USPTO patent grants for SINO IC TECHNOLOGY CO., LTD..The latest application filed is for "universal semiconductor-based automatic high-speed serial signal testing method".

Company Profile

7.9.9

SINO IC TECHNOLOGY CO., LTD. - Shanghai N/A CN
SINO IC TECHNOLOGY CO., LTD. - Pudong New Area CN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Universal semiconductor-based automatic highspeed serial signal testing method Grant 11,336,554 - Yu , et al. May 17, 2	2022-05-17
IC test information management system based on industrial internet Grant 11,042,680 - Luo , et al. June 22, 2	2021-06-22
Halo test method for an optical chip in an integrated circuit Grant 10,977,469 - Wang , et al. April 13, 2	2021-04-13
Optimization Method For Integrated Circuit Wafer Test App 20200309845 - Wang; Hua ; et al.	2020-10-01
Universal Semiconductor-based Automatic High-speed Serial Signal Testing Method App 20200313998 - Yu; Kun ; et al.	2020-10-01
Halo Test Method For An Optical Chip In An Integrated Circuit App 20200311375 - WANG; Hua ; et al.	2020-10-01
Configuration and testing method and system for FPGA chip using bumping process Grant 10,613,145 - Luo , et al.	2020-04-07
Ic Test Information Management System Based On Industrial Internet App 20200089820 - LUO; Bin ; et al.	2020-03-19
Configuration And Testing Method And System For Fpga Chip Using Bumping Process App 20180024194 - LUO; Bin ; et al.	2018-01-25
Ieee 1149.1 Standard Based Testing Methods Used In Packaging App 20160223612 - YE; Shouyin ; et al.	2016-08-04
Test apparatus with physical separation feature Grant 8,878,545 - Zhang , et al. November 4, 2	2014-11-04
Method Of Compressing Test File App 20140114935 - Xu; Hui ; et al.	2014-04-24
Test Apparatus With Physical Separation Feature App 20140070816 - Zhang; Jie ; et al.	2014-03-13

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