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Patent applications and USPTO patent grants for Singhal; Rakshit Kumar.The latest application filed is for "scalable scan-based test architecture with reduced test time and test power".
Patent | Date |
---|---|
Scalable scan-based test architecture with reduced test time and test power Grant 8,510,616 - Singhal August 13, 2 | 2013-08-13 |
Scalable Scan-Based Test Architecture With Reduced Test Time And Test Power App 20090210759 - Singhal; Rakshit Kumar | 2009-08-20 |
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