SINGH, JYOTHI

Patent Applications and Registrations

Patent applications and USPTO patent grants for SINGH, JYOTHI.The latest application filed is for "apparatus for mapping scratches in an oxide film".

Company Profile

0.9.1

SINGH, JYOTHI - HOUSTON TX
Singh; Jyothi - Hopewell Junction NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus For Mapping Scratches In An Oxide Film App 20010013606 - LANDERS, WILLIAM FRANCIS ; et al.	2001-08-16
Combined emissivity and radiance measurement for determination of temperature of radiant object Grant 5,993,059 - O'Neill , et al. November 30, 1	1999-11-30
Control of etch selectivity Grant 5,770,097 - O'Neill , et al. June 23, 1	1998-06-23
Combined emissivity and radiance measurement for the determination of the temperature of a radiant object Grant 5,738,440 - O'Neill , et al. April 14, 1	1998-04-14
Control of etch selectivity Grant 5,683,538 - O'Neill , et al. November 4, 1	1997-11-04
Fluid delivery apparatus and method having an infrared feedline sensor Grant 5,492,718 - O'Neill , et al. February 20, 1	1996-02-20
Methods and apparatus for contamination control in plasma processing Grant 5,387,777 - Bennett , et al. February 7, 1	1995-02-07
Reaction chamber interelectrode gap monitoring by capacitance measurement Grant 5,382,911 - Cotler , et al. January 17, 1	1995-01-17
Method and apparatus for optical emission end point detection in plasma etching processes Grant 5,308,414 - O'Neill , et al. May 3, 1	1994-05-03
Plasma amplified photoelectron process endpoint detection apparatus Grant 4,846,920 - Keller , et al. July 11, 1	1989-07-11

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