Singh; Amandev

Patent Applications and Registrations

Patent applications and USPTO patent grants for Singh; Amandev.The latest application filed is for "metrology apparatus".

Company Profile

1.6.6

Singh; Amandev - Eindhoven NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Metrology apparatus Grant 11,300,889 - Van Dijk , et al. April 12, 2	2022-04-12
Metrology Apparatus App 20210165335 - VAN DIJK; Leon Paul ; et al.	2021-06-03
Method of inspecting a substrate, metrology apparatus, and lithographic system Grant 10,534,274 - Tukker , et al. Ja	2020-01-14
Measurement system, lithographic system, and method of measuring a target Grant 10,437,159 - Tukker , et al. O	2019-10-08
Measurement System, Lithographic System, and Method Of Measuring a Target App 20180164699 - TUKKER; Teunis Willem ; et al.	2018-06-14
Method of Inspecting a Substrate, Metrology Apparatus, and Lithographic System App 20180107124 - TUKKER; Teunis Willem ; et al.	2018-04-19
Focus monitoring arrangement and inspection apparatus including such an arrangement Grant 9,921,489 - Singh , et al. March 20, 2	2018-03-20
Method of measuring asymmetry, inspection apparatus, lithographic system and device manufacturing method Grant 9,786,044 - Fuchs , et al. October 10, 2	2017-10-10
Inspection apparatus and methods, methods of manufacturing devices Grant 9,753,379 - Singh , et al. September 5, 2	2017-09-05
Method Of Measuring Asymmetry, Inspection Apparatus, Lithographic System And Device Manufacturing Method App 20160180517 - FUCHS; Andreas ; et al.	2016-06-23
Focus Monitoring Arrangement and Inspection Apparatus Including such an Arrangement App 20160097984 - SINGH; Amandev ; et al.	2016-04-07
Inspection Apparatus and Methods, Methods of Manufacturing Devices App 20160011523 - SINGH; Amandev ; et al.	2016-01-14

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.