loadpatents
name:-0.0095789432525635
name:-0.022018194198608
name:-0.00047993659973145
SIMS; James S. Patent Filings

SIMS; James S.

Patent Applications and Registrations

Patent applications and USPTO patent grants for SIMS; James S..The latest application filed is for "method of depositing silicon nitride films".

Company Profile
0.21.8
  • SIMS; James S. - Tigard OR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method Of Depositing Silicon Nitride Films
App 20210384028 - SIMS; James S. ;   et al.
2021-12-09
Method for depositing ALD films using halide-based precursors
Grant 10,020,188 - Sims , et al. July 10, 2
2018-07-10
Method For Depositing Ald Films Using Halide-based Precursors
App 20180102245 - Sims; James S. ;   et al.
2018-04-12
Method for depositing metals free ald silicon nitride films using halide-based precursors
Grant 9,824,884 - Sims , et al. November 21, 2
2017-11-21
Tensile dielectric films using UV curing
Grant 9,659,769 - Varadarajan , et al. May 23, 2
2017-05-23
Contoured showerhead for improved plasma shaping and control
Grant 9,598,770 - Leeser , et al. March 21, 2
2017-03-21
Method of depositing ammonia free and chlorine free conformal silicon nitride film
Grant 9,589,790 - Henri , et al. March 7, 2
2017-03-07
Contoured Showerhead For Improved Plasma Shaping And Control
App 20160203953 - Leeser; Karl F. ;   et al.
2016-07-14
Method Of Depositing Ammonia Free And Chlorine Free Conformal Silicon Nitride Film
App 20160148806 - Henri; Jon ;   et al.
2016-05-26
Contoured showerhead for improved plasma shaping and control
Grant 9,315,899 - Leeser , et al. April 19, 2
2016-04-19
Methods and apparatuses for uniform reduction of the in-feature wet etch rate of a silicon nitride film formed by ALD
Grant 9,214,333 - Sims , et al. December 15, 2
2015-12-15
Plasma enhanced atomic layer deposition with pulsed plasma exposure
Grant 9,076,646 - Sims , et al. July 7, 2
2015-07-07
Plasma Enhanced Atomic Layer Deposition With Pulsed Plasma Exposure
App 20140113457 - Sims; James S. ;   et al.
2014-04-24
Contoured Showerhead For Improved Plasma Shaping And Control
App 20130334344 - Leeser; Karl F. ;   et al.
2013-12-19
Cascaded cure approach to fabricate highly tensile silicon nitride films
Grant 8,512,818 - Varadarajan , et al. August 20, 2
2013-08-20
High compressive stress carbon liners for MOS devices
Grant 8,362,571 - Wu , et al. January 29, 2
2013-01-29
Cascaded cure approach to fabricate highly tensile silicon nitride films
Grant 8,211,510 - Varadarajan , et al. July 3, 2
2012-07-03
Method for making high stress boron-doped carbon films
Grant 7,998,881 - Wu , et al. August 16, 2
2011-08-16
High compressive stress carbon liners for MOS devices
Grant 7,906,817 - Wu , et al. March 15, 2
2011-03-15
Method for improving process control and film conformality of PECVD film
Grant 7,745,346 - Hausmann , et al. June 29, 2
2010-06-29
Method For Improving Process Control And Film Conformality Of Pecvd Film
App 20100099271 - Hausmann; Dennis ;   et al.
2010-04-22
PMOS transistor with compressive dielectric capping layer
Grant 7,327,001 - Singhal , et al. February 5, 2
2008-02-05
PMOS transistor with compressive dielectric capping layer
Grant 7,214,630 - Varadarajan , et al. May 8, 2
2007-05-08
Strained transistor architecture and method
Grant 7,041,543 - Varadarajan , et al. May 9, 2
2006-05-09

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed