loadpatents
name:-0.011753082275391
name:-0.011590003967285
name:-0.0061571598052979
Simmons; Michael E. Patent Filings

Simmons; Michael E.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Simmons; Michael E..The latest application filed is for "probe systems including imaging devices with objective lens isolators, and related methods".

Company Profile
4.11.10
  • Simmons; Michael E. - Colton OR
  • Simmons; Michael E - Colton OR
  • Simmons; Michael E. - Rockingham NC
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Probe systems for optically probing a device under test and methods of operating the probe systems
Grant 11,131,709 - Frankel , et al. September 28, 2
2021-09-28
Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems
Grant 11,047,795 - Negishi , et al. June 29, 2
2021-06-29
Probe Systems Including Imaging Devices With Objective Lens Isolators, And Related Methods
App 20210132115 - Negishi; Kazuki ;   et al.
2021-05-06
Probe Systems For Optically Probing A Device Under Test And Methods Of Operating The Probe Systems
App 20210096176 - Frankel; Joseph George ;   et al.
2021-04-01
Calibration Chucks For Optical Probe Systems, Optical Probe Systems Including The Calibration Chucks, And Methods Of Utilizing The Optical Probe Systems
App 20200378888 - Negishi; Kazuki ;   et al.
2020-12-03
Probe systems for testing a device under test
Grant 10,698,002 - Storm , et al.
2020-06-30
Probe Systems For Testing A Device Under Test
App 20190101567 - Storm; Christopher ;   et al.
2019-04-04
Shielded probe systems
Grant 10,060,950 - Simmons , et al. August 28, 2
2018-08-28
High voltage chuck for a probe station
Grant 10,062,597 - Simmons , et al. August 28, 2
2018-08-28
Wafer-handling end effectors with wafer-contacting surfaces and sealing structures
Grant 9,991,152 - Ingram-Goble , et al. June 5, 2
2018-06-05
Grille
Grant D804,644 - Krob, Jr. , et al. December 5, 2
2017-12-05
High Voltage Chuck For A Probe Station
App 20170338142 - Simmons; Michael E. ;   et al.
2017-11-23
Grille
Grant D800,893 - Krob, Jr. , et al. October 24, 2
2017-10-24
High voltage chuck for a probe station
Grant 9,741,599 - Simmons , et al. August 22, 2
2017-08-22
Shielded Probe Systems
App 20170205446 - Simmons; Michael E. ;   et al.
2017-07-20
High voltage chuck for a probe station
Grant 9,506,973 - Simmons , et al. November 29, 2
2016-11-29
High Voltage Chuck For A Probe Station
App 20160195579 - Simmons; Michael E. ;   et al.
2016-07-07
Wafer-handling End Effectors
App 20150255322 - Ingram-Goble; Robbie ;   et al.
2015-09-10
High Voltage Chuck For A Probe Station
App 20130075982 - Simmons; Michael E. ;   et al.
2013-03-28

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