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Patent applications and USPTO patent grants for Simmons; Michael E..The latest application filed is for "probe systems including imaging devices with objective lens isolators, and related methods".
Patent | Date |
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Probe systems for optically probing a device under test and methods of operating the probe systems Grant 11,131,709 - Frankel , et al. September 28, 2 | 2021-09-28 |
Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems Grant 11,047,795 - Negishi , et al. June 29, 2 | 2021-06-29 |
Probe Systems Including Imaging Devices With Objective Lens Isolators, And Related Methods App 20210132115 - Negishi; Kazuki ;   et al. | 2021-05-06 |
Probe Systems For Optically Probing A Device Under Test And Methods Of Operating The Probe Systems App 20210096176 - Frankel; Joseph George ;   et al. | 2021-04-01 |
Calibration Chucks For Optical Probe Systems, Optical Probe Systems Including The Calibration Chucks, And Methods Of Utilizing The Optical Probe Systems App 20200378888 - Negishi; Kazuki ;   et al. | 2020-12-03 |
Probe systems for testing a device under test Grant 10,698,002 - Storm , et al. | 2020-06-30 |
Probe Systems For Testing A Device Under Test App 20190101567 - Storm; Christopher ;   et al. | 2019-04-04 |
Shielded probe systems Grant 10,060,950 - Simmons , et al. August 28, 2 | 2018-08-28 |
High voltage chuck for a probe station Grant 10,062,597 - Simmons , et al. August 28, 2 | 2018-08-28 |
Wafer-handling end effectors with wafer-contacting surfaces and sealing structures Grant 9,991,152 - Ingram-Goble , et al. June 5, 2 | 2018-06-05 |
Grille Grant D804,644 - Krob, Jr. , et al. December 5, 2 | 2017-12-05 |
High Voltage Chuck For A Probe Station App 20170338142 - Simmons; Michael E. ;   et al. | 2017-11-23 |
Grille Grant D800,893 - Krob, Jr. , et al. October 24, 2 | 2017-10-24 |
High voltage chuck for a probe station Grant 9,741,599 - Simmons , et al. August 22, 2 | 2017-08-22 |
Shielded Probe Systems App 20170205446 - Simmons; Michael E. ;   et al. | 2017-07-20 |
High voltage chuck for a probe station Grant 9,506,973 - Simmons , et al. November 29, 2 | 2016-11-29 |
High Voltage Chuck For A Probe Station App 20160195579 - Simmons; Michael E. ;   et al. | 2016-07-07 |
Wafer-handling End Effectors App 20150255322 - Ingram-Goble; Robbie ;   et al. | 2015-09-10 |
High Voltage Chuck For A Probe Station App 20130075982 - Simmons; Michael E. ;   et al. | 2013-03-28 |
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