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name:-0.0084660053253174
name:-0.011525869369507
name:-0.00058484077453613
Sim; Hak Chuah Patent Filings

Sim; Hak Chuah

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sim; Hak Chuah.The latest application filed is for "methods and systems for inspecting integrated circuits based on x-rays".

Company Profile
0.7.7
  • Sim; Hak Chuah - Rancho Santa Margarita CA
  • Sim; Hak Chuah - Painted Post NY
  • Sim; Hak Chuah - Dallas TX
  • Sim; Hak Chuah - Garland TX
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Methods And Systems For Inspecting Integrated Circuits Based On X-rays
App 20220042795 - Peterson; Brennan Lovelace ;   et al.
2022-02-10
Imaging-based methods for detecting and measuring defects in extruded cellular ceramic articles
Grant 9,996,766 - Richard , et al. June 12, 2
2018-06-12
Imaging-based Methods For Detecting And Measuring Defects In Extruded Cellular Ceramic Articles
App 20160321797 - Richard; DiRisio Carlo ;   et al.
2016-11-03
Optical reader systems and methods with rapid microplate position detection
Grant 8,810,804 - Hollenbeck , et al. August 19, 2
2014-08-19
Optical Reader Systems And Methods With Rapid Microplate Position Detection
App 20130100462 - Hollenbeck; Ronald Charles ;   et al.
2013-04-25
Edge normal process
Grant 7,706,599 - Sim April 27, 2
2010-04-27
Edge Normal Process
App 20080204756 - Sim; Hak Chuah
2008-08-28
Edge normal process
Grant 7,366,344 - Sim April 29, 2
2008-04-29
Edge normal process
App 20060115142 - Sim; Hak Chuah
2006-06-01
System and method for inspection using off-angle lighting
Grant 7,024,031 - Castellanos-Nolasco , et al. April 4, 2
2006-04-04
Edge normal process
Grant 6,947,588 - Sim September 20, 2
2005-09-20
Edge normal process
App 20050013474 - Sim, Hak Chuah
2005-01-20

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