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Patent applications and USPTO patent grants for Sim; Hak Chuah.The latest application filed is for "methods and systems for inspecting integrated circuits based on x-rays".
Patent | Date |
---|---|
Methods And Systems For Inspecting Integrated Circuits Based On X-rays App 20220042795 - Peterson; Brennan Lovelace ;   et al. | 2022-02-10 |
Imaging-based methods for detecting and measuring defects in extruded cellular ceramic articles Grant 9,996,766 - Richard , et al. June 12, 2 | 2018-06-12 |
Imaging-based Methods For Detecting And Measuring Defects In Extruded Cellular Ceramic Articles App 20160321797 - Richard; DiRisio Carlo ;   et al. | 2016-11-03 |
Optical reader systems and methods with rapid microplate position detection Grant 8,810,804 - Hollenbeck , et al. August 19, 2 | 2014-08-19 |
Optical Reader Systems And Methods With Rapid Microplate Position Detection App 20130100462 - Hollenbeck; Ronald Charles ;   et al. | 2013-04-25 |
Edge normal process Grant 7,706,599 - Sim April 27, 2 | 2010-04-27 |
Edge Normal Process App 20080204756 - Sim; Hak Chuah | 2008-08-28 |
Edge normal process Grant 7,366,344 - Sim April 29, 2 | 2008-04-29 |
Edge normal process App 20060115142 - Sim; Hak Chuah | 2006-06-01 |
System and method for inspection using off-angle lighting Grant 7,024,031 - Castellanos-Nolasco , et al. April 4, 2 | 2006-04-04 |
Edge normal process Grant 6,947,588 - Sim September 20, 2 | 2005-09-20 |
Edge normal process App 20050013474 - Sim, Hak Chuah | 2005-01-20 |
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