Sim; Guee Hwang

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sim; Guee Hwang.The latest application filed is for "method of forming patterns of semiconductor device".

Company Profile

0.7.9

Sim; Guee Hwang - Icheon-si KR
Sim; Guee Hwang - Gangwon-do KR
Sim; Guee Hwang - Gangleung-si KR
Sim; Guee-Hwang - Gangneung-si KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of forming patterns of semiconductor device Grant 8,318,408 - Jung , et al. November 27, 2	2012-11-27
Method of manufacturing semiconductor devices Grant 8,221,961 - Sim July 17, 2	2012-07-17
Method of forming an etching mask pattern from developed negative and positive photoresist layers Grant 7,851,135 - Jung , et al. December 14, 2	2010-12-14
Method of manufacturing flash memory device Grant 7,687,403 - Sim , et al. March 30, 2	2010-03-30
Method of Forming Patterns of Semiconductor Device App 20100021849 - Jung; Woo Yung ; et al.	2010-01-28
Method of fabricating semiconductor device Grant 7,651,933 - Sim January 26, 2	2010-01-26
Overlay accuracy measurement vernier and method of forming the same Grant 7,638,263 - Sim December 29, 2	2009-12-29
Method of forming pattern of semiconductor device Grant 7,595,145 - Sim , et al. September 29, 2	2009-09-29
Method Of Manufacturing Semiconductor Devices App 20090181327 - SIM; Guee Hwang	2009-07-16
Method Of Forming Pattern Of Semiconductor Device App 20090170033 - Jung; Woo Yung ; et al.	2009-07-02
Method Of Forming Mask Pattern App 20090142711 - Jung; Woo Yung ; et al.	2009-06-04
Method Of Fabricating Semiconductor Device App 20090053879 - SIM; Guee-Hwang	2009-02-26
Method of Fabricating Semiconductor Device App 20080268607 - Sim; Guee Hwang	2008-10-30
Method Of Forming Pattern Of Semiconductor Device App 20080081297 - Sim; Guee Hwang ; et al.	2008-04-03
Method Of Manufacturing Flash Memory Device App 20080064216 - Sim; Guee Hwang ; et al.	2008-03-13
Overlay accuracy measurement vernier and method of forming the same App 20070212650 - Sim; Guee Hwang	2007-09-13

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