Silberstein; Shai

Patent Applications and Registrations

Patent applications and USPTO patent grants for Silberstein; Shai.The latest application filed is for "meat analogues and methods of producing the same".

Company Profile

1.19.25

Silberstein; Shai - Ness Ziona IL
Silberstein; Shai - Rishon Le Zion IL
Silberstein; Shai - Risbon Le-Zion IL
Silberstein; Shai - Rehovot IL
Silberstein; Shai - Rishon LeZion IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Meat Analogues And Methods Of Producing The Same App 20220125072 - Ben-Shitrit; Eshchar ; et al.	2022-04-28
Systems and methods for object detection Grant 10,046,715 - Levi , et al. August 14, 2	2018-08-14
Systems And Methods For Object Detection App 20160117560 - LEVI; DAN ; et al.	2016-04-28
Photography-task-specific Digital Camera Apparatus And Methods Useful In Conjunction Therewith App 20140168462 - Silberstein; Shai	2014-06-19
Photography-task-specific digital camera apparatus and methods useful in conjunction therewith Grant 8,681,226 - Silberstein March 25, 2	2014-03-25
Photography-task-specific Digital Camera Apparatus And Methods Useful In Conjunction Therewith App 20120182435 - Silberstein; Shai	2012-07-19
Photography-specific digital camera apparatus and methods useful in conjunction therewith Grant 8,169,484 - Silberstein May 1, 2	2012-05-01
Optical inspection tools featuring parallel post-inspection analysis Grant 8,135,207 - Silberstein , et al. March 13, 2	2012-03-13
Method And System For Evaluating The Condition Of A Collection Of Similar Elongated Hollow Objects App 20120053895 - Amir; Noam ; et al.	2012-03-01
Optical inspection tool featuring multiple speed modes Grant 8,098,372 - Eitan , et al. January 17, 2	2012-01-17
Printed fourier filtering in optical inspection tools Grant 8,031,931 - Fuchs , et al. October 4, 2	2011-10-04
Dynamic illumination in optical inspection systems Grant 7,973,921 - Silberstein , et al. July 5, 2	2011-07-05
System for detection of wafer defects Grant 7,961,763 - Furman , et al. June 14, 2	2011-06-14
Optical inspection including partial scanning of wafers Grant 7,924,420 - Shomrony , et al. April 12, 2	2011-04-12
System for detection of wafer defects Grant 7,843,559 - Furman , et al. November 30, 2	2010-11-30
Inspection tools supporting multiple operating states for multiple detector arrangements Grant 7,826,049 - Furman , et al. November 2, 2	2010-11-02
Method and apparatus for detecting defects in wafers including alignment of the wafer images so as to induce the same smear in all images Grant 7,804,993 - Dorphan , et al. September 28, 2	2010-09-28
Image splitting in optical inspection systems Grant 7,719,674 - Furman , et al. May 18, 2	2010-05-18
Image splitting in optical inspection systems Grant 7,714,998 - Furman , et al. May 11, 2	2010-05-11
Wafer inspection using short-pulsed continuous broadband illumination Grant 7,659,973 - Furman , et al. February 9, 2	2010-02-09
Dynamic Illumination in Optical Inspection Systems App 20090323052 - Silberstein; Shai ; et al.	2009-12-31
Optical Inspection Tools Featuring Parallel Post-Inspection Analysis App 20090324057 - Silberstein; Shai ; et al.	2009-12-31
Apparatus for determining optimum position of focus of an imaging system Grant 7,633,041 - Furman , et al. December 15, 2	2009-12-15
Wafer Inspection Using Short-pulsed Continuous Broadband Illumination App 20090225307 - Furman; Dov ; et al.	2009-09-10
Inspection Tools Supporting Multiple Operating States for Multiple Detector Arrangements App 20090201494 - Furman; Dov ; et al.	2009-08-13
System for detection of water defects Grant 7,525,659 - Furman , et al. April 28, 2	2009-04-28
Optical Inspection Tool Featuring Multiple Speed Modes App 20090030630 - Eitan; Giora ; et al.	2009-01-29
System for detection of wafer defects Grant 7,477,383 - Furman , et al. January 13, 2	2009-01-13
Optical Inspection Including Partial Scanning of Wafers App 20080307908 - Shomrony; Gilad ; et al.	2008-12-18
Image Splitting in Optical Inspection Systems App 20080137074 - Furman; Dov ; et al.	2008-06-12
Image Splitting in Optical Inspection Systems App 20080137073 - Furman; Dov ; et al.	2008-06-12
Wafer Inspection Using Short-Pulsed Continuous Broadband Illumination App 20070273945 - Furman; Dov ; et al.	2007-11-29
Printed fourier filtering in optical inspection tools App 20070247668 - Fuchs; Dan T. ; et al.	2007-10-25
System for detection of wafer defects App 20070019856 - Furman; Dov ; et al.	2007-01-25
Photography-specific digital camera apparatus and methods useful in conjunction therewith App 20070019094 - Silberstein; Shai	2007-01-25
System for detection of wafer defects App 20070013903 - Furman; Dov ; et al.	2007-01-18
System for detection of wafer defects App 20060244958 - Furman; Dov ; et al.	2006-11-02
System for detection of wafer defects App 20060244956 - Furman; Dov ; et al.	2006-11-02
System for detection of wafer defects App 20060244957 - Furman; Dov ; et al.	2006-11-02
Method and apparatus for detecting defects in wafers including alignment of the wafer images so as to induce the same smear in all images App 20060193506 - Dorphan; Yuval ; et al.	2006-08-31
System for detection of wafer defects App 20050110987 - Furman, Dov ; et al.	2005-05-26
System for detection of wafer defects App 20040146295 - Furman, Dov ; et al.	2004-07-29

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.