loadpatents
name:-0.016495943069458
name:-0.013966798782349
name:-0.0024709701538086
Shur; Dmitry Patent Filings

Shur; Dmitry

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shur; Dmitry.The latest application filed is for "charged particle detection system".

Company Profile
2.13.11
  • Shur; Dmitry - Holon IL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Charged particle detection system
Grant 11,322,333 - Shur , et al. May 3, 2
2022-05-03
Charged Particle Detection System
App 20210280387 - SHUR; Dmitry ;   et al.
2021-09-09
Charged particle detection system
Grant 11,031,210 - Shur , et al. June 8, 2
2021-06-08
Particle detection assembly, system and method
Grant 10,910,193 - Cheifetz , et al. February 2, 2
2021-02-02
Charged Particle Detection System
App 20200312609 - SHUR; Dmitry ;   et al.
2020-10-01
Particle Detection Assembly, System And Method
App 20190259571 - CHEIFETZ; ELI ;   et al.
2019-08-22
Method and apparatus for lithographic mask production
Grant 9,442,369 - Shur , et al. September 13, 2
2016-09-13
System and method of SEM overlay metrology
Grant 9,214,317 - Shur December 15, 2
2015-12-15
System and Method of SEM Overlay Metrology
App 20140353498 - Shur; Dmitry
2014-12-04
System and method for material analysis of a microscopic element
Grant 8,546,756 - Shur , et al. October 1, 2
2013-10-01
System And Method For Material Analysys Of A Microscopic Element
App 20110024622 - Shur; Dmitry
2011-02-03
High current electron beam inspection
Grant 7,602,197 - Kadyshevitch , et al. October 13, 2
2009-10-13
Contact opening metrology
Grant 7,476,875 - Kadyshevitch , et al. January 13, 2
2009-01-13
Specimen current mapper
Grant 7,473,911 - Kadyshevitch , et al. January 6, 2
2009-01-06
Contact opening metrology
Grant 7,381,978 - Kadyshevitch , et al. June 3, 2
2008-06-03
Contact Opening Metrology
App 20070257191 - Kadyshevitch; Alexander ;   et al.
2007-11-08
Contact opening metrology
Grant 7,279,689 - Kadyshevitch , et al. October 9, 2
2007-10-09
High current electron beam inspection
App 20070057687 - Kadyshevitch; Alexander ;   et al.
2007-03-15
Contact opening metrology
App 20060113471 - Kadyshevitch; Alexander ;   et al.
2006-06-01
Contact opening metrology
Grant 7,038,224 - Kadyshevitch , et al. May 2, 2
2006-05-02
Contact opening metrology
App 20050173657 - Kadyshevitch, Alexander ;   et al.
2005-08-11
Specimen current mapper
App 20040084622 - Kadyshevitch, Alexander ;   et al.
2004-05-06
Contact opening metrology
App 20040021076 - Kadyshevitch, Alexander ;   et al.
2004-02-05

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