loadpatents
name:-0.0065140724182129
name:-0.031139135360718
name:-0.00046896934509277
Shroff; Mehul Patent Filings

Shroff; Mehul

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shroff; Mehul.The latest application filed is for "safe operating area checking method and apparatus".

Company Profile
0.9.10
  • Shroff; Mehul - Austin TX US
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Safe operating area checking method and apparatus
Grant 10,041,993 - Hours , et al. August 7, 2
2018-08-07
Substrate contacts for a transistor
Grant 10,038,081 - Reber , et al. July 31, 2
2018-07-31
Simulation system and method for testing a simulation of a device against one or more violation rules
Grant 9,443,041 - Shroff , et al. September 13, 2
2016-09-13
Simulation system and method for testing a simulation of a device against one or more violation rules
Grant 9,424,379 - Hours , et al. August 23, 2
2016-08-23
Safe Operating Area Checking Method And Apparatus
App 20160223608 - HOURS; Xavier ;   et al.
2016-08-04
Simulation System And Method For Testing A Simulation Of A Device Against One Or More Violation Rules
App 20150143308 - Shroff; Mehul ;   et al.
2015-05-21
Simulation System And Method For Testing A Simulation Of A Device Against One Or More Violation Rules
App 20150121325 - Hours; Xavier ;   et al.
2015-04-30
Mismatch Verification Device And Methods Thereof
App 20130305202 - Shroff; Mehul ;   et al.
2013-11-14
Integrated circuit device having sidewall spacers along conductors
Grant 6,717,269 - Shroff , et al. April 6, 2
2004-04-06
Dielectric between metal structures and method therefor
App 20030143832 - Shroff, Mehul ;   et al.
2003-07-31
Dielectric between metal structures and method therefor
Grant 6,583,043 - Shroff , et al. June 24, 2
2003-06-24
Dielectric between metal structures and method therefor
App 20030022483 - Shroff, Mehul ;   et al.
2003-01-30

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