Shortt; David

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shortt; David.The latest application filed is for "defect marking for semiconductor wafer inspection".

Company Profile

0.11.7

Shortt; David - Los Gatos CA
Shortt; David - Milpitas CA US
Shortt; David - Christmas FL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Defect marking for semiconductor wafer inspection Grant 10,082,470 - Shortt , et al. September 25, 2	2018-09-25
Defect Marking For Semiconductor Wafer Inspection App 20180088056 - Shortt; David ; et al.	2018-03-29
Systems and methods for inspecting specimens including specimens that have a substantially rough uppermost layer Grant 8,582,094 - Shortt , et al. November 12, 2	2013-11-12
Taping knife with hammer Grant 8,060,962 - Shortt November 22, 2	2011-11-22
Taping Knife With Hammer App 20110056027 - Shortt; David	2011-03-10
Systems and methods for inspecting a wafer with increased sensitivity Grant 7,697,129 - Haller , et al. April 13, 2	2010-04-13
Methods and systems for inspection of a wafer Grant 7,554,656 - Shortt , et al. June 30, 2	2009-06-30
Enhanced simultaneous multi-spot inspection and imaging Grant 7,489,393 - Biellak , et al. February 10, 2	2009-02-10
Systems And Methods For Inspecting A Wafer With Increased Sensitivity App 20090009754 - Haller; Kurt L. ; et al.	2009-01-08
Systems and methods for determining a characteristic of a specimen Grant 7,463,349 - Biellak , et al. December 9, 2	2008-12-09
Computer-implemented methods and systems for determining a configuration for a light scattering inspection system Grant 7,436,505 - Belyaev , et al. October 14, 2	2008-10-14
Systems and methods for inspecting a wafer with increased sensitivity Grant 7,372,559 - Haller , et al. May 13, 2	2008-05-13
Methods and systems for inspecting a specimen using light scattered in different wavelength ranges Grant 7,304,310 - Shortt , et al. December 4, 2	2007-12-04
Computer-Implemented Methods and Systems for Determining a Configuration for a Light Scattering Inspection System App 20070229809 - Belyaev; Alexander ; et al.	2007-10-04
Systems and methods for inspecting a wafer with increased sensitivity App 20070132987 - Haller; Kurt L. ; et al.	2007-06-14
Methods and systems for inspection of a wafer App 20070081151 - Shortt; David ; et al.	2007-04-12
Enhanced simultaneous multi-spot inspection and imaging App 20060197946 - Biellak; Stephen ; et al.	2006-09-07

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