SHKALIM; Ariel

Patent Applications and Registrations

Patent applications and USPTO patent grants for SHKALIM; Ariel.The latest application filed is for "mask inspection of a semiconductor specimen".

Company Profile

4.4.6

SHKALIM; Ariel - DN Sede-Gat IL
Shkalim; Ariel - Even-Shmuel IL
Shkalim; Ariel - Sede-Gat IL
Shkalim; Ariel - D.N. Sade-Gat IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Mask Inspection Of A Semiconductor Specimen App 20220254000 - SHKALIM; Ariel ; et al.	2022-08-11
Determining A Critical Dimension Variation Of A Pattern App 20220198639 - Vereschagin; Vadim ; et al.	2022-06-23
Mask inspection of a semiconductor specimen Grant 11,348,224 - Shkalim , et al. May 31, 2	2022-05-31
Determining a critical dimension variation of a pattern Grant 11,276,160 - Vereschagin , et al. March 15, 2	2022-03-15
Mask Inspection Of A Semiconductor Specimen App 20210073963 - SHKALIM; Ariel ; et al.	2021-03-11
Determining A Critical Dimension Variation Of A Pattern App 20200327652 - VERESCHAGIN; Vadim ; et al.	2020-10-15
Method of generating an examination recipe and system thereof Grant 10,290,087 - Shkalim , et al.	2019-05-14
Method Of Generating An Examination Recipe And System Thereof App 20190080447 - SHKALIM; Ariel ; et al.	2019-03-14
Systems, methods and computer program products for signature detection Grant 9,613,255 - Amzaleg , et al. April 4, 2	2017-04-04
Systems, Methods And Computer Program Products For Signature Detection App 20160292492 - AMZALEG; Moshe ; et al.	2016-10-06

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