Shitara; Kenichi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shitara; Kenichi.The latest application filed is for "surface defect inspection method and apparatus".

Company Profile

0.15.15

Shitara; Kenichi - Kamisato N/A JP
Shitara; Kenichi - Ashigarakami-gun JP
Shitara; Kenichi - Kanagawa JP
Shitara; Kenichi - Kanagawa-ken JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Optical surface defect inspection apparatus and optical surface defect inspection method Grant 8,547,547 - Tamura , et al. October 1, 2	2013-10-01
Surface defect inspection method and apparatus Grant 8,502,966 - Shitara , et al. August 6, 2	2013-08-06
Surface defect inspection method and apparatus Grant 8,488,116 - Shitara , et al. July 16, 2	2013-07-16
Disk protrusion detection/flatness measurement circuit and disk glide tester Grant 8,457,926 - Shitara , et al. June 4, 2	2013-06-04
Surface Defect Inspection Method And Apparatus App 20130027693 - SHITARA; Kenichi ; et al.	2013-01-31
Surface Defect Inspection Method And Apparatus App 20130027694 - SHITARA; Kenichi ; et al.	2013-01-31
Surface defect inspection method and apparatus Grant 8,294,888 - Shitara , et al. October 23, 2	2012-10-23
Method and its apparatus for inspecting a magnetic disk Grant 8,295,000 - Shitara , et al. October 23, 2	2012-10-23
Optical Surface Defect Inspection Apparatus And Optical Surface Defect Inspection Method App 20120075625 - TAMURA; Shintaro ; et al.	2012-03-29
Method And Apparatus For Inspecting Magnetic Disk App 20120026622 - SHITARA; Kenichi ; et al.	2012-02-02
Deterioration detection method of composite magnetic head and magnetic disk inspection apparatus Grant 8,089,714 - Shitara , et al. January 3, 2	2012-01-03
Method for measuring optimum seeking time and inspection apparatus using the same Grant 8,031,421 - Shitara , et al. October 4, 2	2011-10-04
Method And Its Apparatus For Inspecting A Magnetic Disk App 20110188143 - SHITARA; Kenichi ; et al.	2011-08-04
Test method of a magnetic disk and magnectic disk tester Grant 7,929,232 - Shitara , et al. April 19, 2	2011-04-19
Surface Defect Inspection Method And Apparatus App 20110075148 - SHITARA; Kenichi ; et al.	2011-03-31
Disk Protrusion Detection/flatness Measurement Circuit And Disk Glide Tester App 20110051580 - SHITARA; Kenichi ; et al.	2011-03-03
Deterioration Detection Method Of Composite Magnetic Head And Magnetic Disk Inspection Apparatus App 20110002060 - SHITARA; Kenichi ; et al.	2011-01-06
Method For Measuring Optimum Seeking Time And Inspection Apparatus Using The Same App 20100302665 - SHITARA; Kenichi ; et al.	2010-12-02
Test Method Of A Magnetic Disk And Magnectic Disk Tester App 20080198493 - SHITARA; Kenichi ; et al.	2008-08-21
Magnetic Disk Defect Test Method, Protrusion Test Device And Glide Tester App 20070245814 - Shitara; Kenichi ; et al.	2007-10-25
Magnetic head positioning control device, magnetic head certifier, magnetic disk certifier and head cartridge Grant 7,035,039 - Shitara , et al. April 25, 2	2006-04-25
Magnetic head positioning control device, magnetic head certifier, magnetic disk certifier and head cartridge App 20030128456 - Shitara, Kenichi ; et al.	2003-07-10
Magnetic disk read/write circuit having core coils of opposite phase Grant 6,473,258 - Shitara , et al. October 29, 2	2002-10-29
Defect detector circuit and magnetic disk certifier using the same defect detector circuit App 20020041184 - Funaki, Toshiharu ; et al.	2002-04-11

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