Shirasaki; Yasuhiro
Patent Applications and Registrations
Patent applications and USPTO patent grants for Shirasaki; Yasuhiro.The latest application filed is for "device defect detection method using a charged particle beam".
- Shirasaki; Yasuhiro - Tokyo JP
- Shirasaki; Yasuhiro - Tachikawa N/A JP
- Shirasaki; Yasuhiro - Fuchu JP
| Patent | Date |
|---|---|
| Measurement system and method for setting observation conditions of measurement apparatus Grant 11,380,518 - Miwa , et al. July 5, 2 | 2022-07-05 |
| Charged particle beam device Grant 11,355,308 - Shirasaki , et al. June 7, 2 | 2022-06-07 |
| Information processing system and information processing method Grant 11,334,761 - Krasienapibal , et al. May 17, 2 | 2022-05-17 |
| Charged particle beam device Grant 11,328,897 - Shouji , et al. May 10, 2 | 2022-05-10 |
| Device Defect Detection Method Using A Charged Particle Beam App 20220108866 - Shirasaki; Yasuhiro ; et al. | 2022-04-07 |
| Measurement System and Method for Setting Observation Conditions of Measurement Apparatus App 20210407763 - MIWA; Takafumi ; et al. | 2021-12-30 |
| Charged particle beam application apparatus Grant 11,177,108 - Shirasaki , et al. November 16, 2 | 2021-11-16 |
| Charged Particle Beam Device App 20210066029 - Shouji; Minami ; et al. | 2021-03-04 |
| Charged Particle Beam Device App 20210066028 - Shirasaki; Yasuhiro ; et al. | 2021-03-04 |
| Charged Particle Beam Application Apparatus App 20210005417 - Shirasaki; Yasuhiro ; et al. | 2021-01-07 |
| Image forming apparatus Grant 10,755,396 - Enyama , et al. A | 2020-08-25 |
| Information Processing System And Information Processing Method App 20200257937 - A1 | 2020-08-13 |
| Analyzing System App 20200225175 - KAGATSUME; Akiko ; et al. | 2020-07-16 |
| Charged particle beam device Grant 10,651,004 - Shirasaki , et al. | 2020-05-12 |
| Scanning electron microscope and image processing apparatus Grant 10,483,083 - Krasienapibal , et al. Nov | 2019-11-19 |
| Charged particle detector and charged particle beam device using the same Grant 10,361,063 - Shirasaki , et al. | 2019-07-23 |
| Charged Particle Beam Device App 20190131104 - SHIRASAKI; Yasuhiro ; et al. | 2019-05-02 |
| Charged particle beam apparatus Grant 10,256,068 - Enyama , et al. | 2019-04-09 |
| Scanning Electron Microscope And Image Processing Apparatus App 20190035597 - KRASIENAPIBAL; Thantip ; et al. | 2019-01-31 |
| Charged Particle Detector and Charged Particle Beam Device Using the Same App 20180261425 - SHIRASAKI; Yasuhiro ; et al. | 2018-09-13 |
| Image Forming Apparatus App 20180232869 - ENYAMA; Momoyo ; et al. | 2018-08-16 |
| Charged particle beam device and aberration corrector Grant 9,991,088 - Shirasaki , et al. June 5, 2 | 2018-06-05 |
| Near-infrared light emitting device using semiconductor nanocrystals Grant 9,935,240 - Supran , et al. April 3, 2 | 2018-04-03 |
| Charged Particle Beam Apparatus App 20180033587 - ENYAMA; Momoyo ; et al. | 2018-02-01 |
| Charged Particle Beam Device and Aberration Corrector App 20180025886 - SHIRASAKI; Yasuhiro ; et al. | 2018-01-25 |
| Near-infrared Light Emitting Device Using Semiconductor Nanocrystals App 20140158977 - SUPRAN; Geoffrey J.S. ; et al. | 2014-06-12 |
| Method, apparatus and program for establishing encrypted communication channel between apparatuses Grant 8,515,066 - Saito , et al. August 20, 2 | 2013-08-20 |
| Method, apparatus and program for establishing encrypted communication channel between apparatuses App 20070133803 - Saito; Makoto ; et al. | 2007-06-14 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 