Shirakawabe; Yoshiharu
Patent Applications and Registrations
Patent applications and USPTO patent grants for Shirakawabe; Yoshiharu.The latest application filed is for "cell detachment method".
- Shirakawabe; Yoshiharu - Chiba N/A JP
- Shirakawabe; Yoshiharu - Shizuoka JP
- Shirakawabe; Yoshiharu - Chiba-shi JP
- Shirakawabe; Yoshiharu - Sunto-gun JP
| Patent | Date |
|---|---|
| Cell detachment method Grant 8,859,279 - Nihei , et al. October 14, 2 | 2014-10-14 |
| Cantilever and cantilever manufacturing method Grant 7,823,470 - Shigeno , et al. November 2, 2 | 2010-11-02 |
| Method for manufacturing a split probe Grant 7,494,575 - Sadayama , et al. February 24, 2 | 2009-02-24 |
| Method for fabricating nanometer-scale structure Grant 7,476,418 - Yasutake , et al. January 13, 2 | 2009-01-13 |
| Scanning probe microscope and scanning method Grant 7,456,400 - Shigeno , et al. November 25, 2 | 2008-11-25 |
| Probe for a scanning microscope Grant 7,398,678 - Nakayama , et al. July 15, 2 | 2008-07-15 |
| Surface characteristic analysis apparatus Grant 7,337,656 - Shirakawabe , et al. March 4, 2 | 2008-03-04 |
| Cell detachment method App 20070292946 - Nihei; Amiko ; et al. | 2007-12-20 |
| Multi-tip Surface Cantilever Probe App 20070278405 - Shirakawabe; Yoshiharu ; et al. | 2007-12-06 |
| Cantilever and cantilever manufacturing method App 20070214875 - Shigeno; Masatsugu ; et al. | 2007-09-20 |
| Living cell observing cell App 20070134787 - Shirakawabe; Yoshiharu ; et al. | 2007-06-14 |
| Probe for a scanning microscope App 20060150720 - Nakayama; Yoshikazu ; et al. | 2006-07-13 |
| Scanning probe microscope and scanning method App 20060113472 - Shigeno; Masatsugu ; et al. | 2006-06-01 |
| Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus App 20060011467 - Shirakawabe; Yoshiharu ; et al. | 2006-01-19 |
| Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus App 20060011830 - Shirakawabe; Yoshiharu ; et al. | 2006-01-19 |
| Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus Grant 6,953,519 - Shirakawabe , et al. October 11, 2 | 2005-10-11 |
| Scanning probe microscope and operation method Grant 6,941,798 - Yamaoka , et al. September 13, 2 | 2005-09-13 |
| Heated self-detecting type cantilever for atomic force microscope Grant 6,932,504 - Takahashi , et al. August 23, 2 | 2005-08-23 |
| Method for manufacturing a split probe App 20050133717 - Sadayama, Shoji ; et al. | 2005-06-23 |
| Method for fabricating nanometer-scale structure App 20050089463 - Yasutake, Masatoshi ; et al. | 2005-04-28 |
| Conductive probe for scanning microscope and machining method using the same Grant 6,787,769 - Nakayama , et al. September 7, 2 | 2004-09-07 |
| Probe for scanning microscope produced by focused ion beam machining Grant 6,759,653 - Nakayama , et al. July 6, 2 | 2004-07-06 |
| Scanning probe microscope and operation method App 20040093935 - Yamaoka, Takehiro ; et al. | 2004-05-20 |
| Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus App 20040074288 - Shirakawabe, Yoshiharu ; et al. | 2004-04-22 |
| Cantilever for vertical scanning microscope and probe for vertical scan microscope Grant 6,705,154 - Nakayama , et al. March 16, 2 | 2004-03-16 |
| Temperature measurement probe and temperature measurement apparatus App 20040028119 - Takahashi, Hiroshi ; et al. | 2004-02-12 |
| Microprobe and scanning probe apparatus having microprobe Grant 6,667,467 - Shimizu , et al. December 23, 2 | 2003-12-23 |
| Microprobe and sample surface measuring apparatus Grant 6,664,540 - Shimizu , et al. December 16, 2 | 2003-12-16 |
| Cantilever for vertical scanning microscope and probe for vertical scan microscope App 20030010100 - Nakayama, Yoshikazu ; et al. | 2003-01-16 |
| SPM physical characteristic measuring method, measurement program, and SPM device App 20020179833 - Shirakawabe, Yoshiharu ; et al. | 2002-12-05 |
| Self-detecting type SPM probe App 20020178801 - Takahashi, Hiroshi ; et al. | 2002-12-05 |
| Self-detecting type of SPM probe and SPM device Grant 6,388,252 - Takahashi , et al. May 14, 2 | 2002-05-14 |
| Microprobe and scanning type probe apparatus using thereof App 20020020805 - Shimizu, Nobuhiro ; et al. | 2002-02-21 |
| Microprobe and sample surface measuring apparatus App 20010028033 - Shimizu, Nobuhiro ; et al. | 2001-10-11 |
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