Shinke; Wakana
Patent Applications and Registrations
Patent applications and USPTO patent grants for Shinke; Wakana.The latest application filed is for "inspecting method and apparatus for repeated micro-miniature patterns".
- Shinke; Wakana - Hamura JP
- Shinke, Wakana - Hamura-shi JP
| Patent | Date |
|---|---|
| Inspecting method and apparatus for repeated micro-miniature patterns Grant 6,944,325 - Taguchi , et al. September 13, 2 | 2005-09-13 |
| Inspecting method and apparatus for repeated micro-miniature patterns App 20040047500 - Taguchi, Junichi ; et al. | 2004-03-11 |
| Inspecting method and apparatus for repeated micro-miniature patterns Grant 6,661,912 - Taguchi , et al. December 9, 2 | 2003-12-09 |
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