Shinde; Makarand S.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shinde; Makarand S..The latest application filed is for "apparatus and method for managing thermally induced motion of a probe card assembly".

Company Profile

0.15.14

Shinde; Makarand S. - Livermore CA
Shinde; Makarand S. - Dublin CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and apparatus for adjusting a multi-substrate probe structure Grant 7,845,072 - Hobbs , et al. December 7, 2	2010-12-07
Probe card configuration for low mechanical flexural strength electrical routing substrates Grant 7,825,674 - Shinde , et al. November 2, 2	2010-11-02
Sawing tile corners on probe card substrates Grant 7,692,433 - Eldridge , et al. April 6, 2	2010-04-06
Apparatus and method for adjusting an orientation of probes Grant 7,671,614 - Eldridge , et al. March 2, 2	2010-03-02
Mechanically reconfigurable vertical tester interface for IC probing Grant 7,659,736 - Eldridge , et al. February 9, 2	2010-02-09
Apparatus And Method For Managing Thermally Induced Motion Of A Probe Card Assembly App 20100000080 - Eldridge; Benjamin N. ; et al.	2010-01-07
Method and system for compensating thermally induced motion of probe cards Grant 7,642,794 - Eldridge , et al. January 5, 2	2010-01-05
Apparatus and method for managing thermally induced motion of a probe card assembly Grant 7,592,821 - Eldridge , et al. September 22, 2	2009-09-22
Method and system for compensating thermally induced motion of probe cards Grant 7,560,941 - Martens , et al. July 14, 2	2009-07-14
Method And Apparatus For Adjusting A Multi-substrate Probe Structure App 20090158586 - Hobbs; Eric D. ; et al.	2009-06-25
Method and apparatus for adjusting a multi-substrate probe structure Grant 7,471,094 - Hobbs , et al. December 30, 2	2008-12-30
Apparatus And Method For Managing Thermally Induced Motion Of A Probe Card Assembly App 20080042668 - Eldridge; Benjamin N. ; et al.	2008-02-21
Method and system for compensating thermally induced motion of probe cards Grant 7,312,618 - Eldridge , et al. December 25, 2	2007-12-25
Sawing tile corners on probe card substrates App 20070290705 - Eldridge; Benjamin N. ; et al.	2007-12-20
Apparatus and method for managing thermally induced motion of a probe card assembly Grant 7,285,968 - Eldridge , et al. October 23, 2	2007-10-23
Mechanically Reconfigurable Vertical Tester Interface For Ic Probing App 20070229102 - Eldridge; Benjamin N. ; et al.	2007-10-04
Mechanically reconfigurable vertical tester interface for IC probing Grant 7,230,437 - Eldridge , et al. June 12, 2	2007-06-12
Apparatus And Method For Adjusting An Orientation Of Probes App 20070126435 - Eldridge; Benjamin N. ; et al.	2007-06-07
Method and apparatus for adjusting a multi-substrate probe structure App 20060290367 - Hobbs; Eric D. ; et al.	2006-12-28
Apparatus And Method For Managing Thermally Induced Motion Of A Probe Card Assembly App 20060255814 - Eldridge; Benjamin N. ; et al.	2006-11-16
Probe card configuration for low mechanical flexural strength electrical routing substrates App 20060244470 - Shinde; Makarand S. ; et al.	2006-11-02
Method And System For Compensating Thermally Induced Motion Of Probe Cards App 20060238211 - Eldridge; Benjamin N. ; et al.	2006-10-26
Probe card with coplanar daughter card Grant 7,116,119 - Sporck , et al. October 3, 2	2006-10-03
Probe card configuration for low mechanical flexural strength electrical routing substrates Grant 7,071,715 - Shinde , et al. July 4, 2	2006-07-04
Mechanically reconfigurable vertical tester interface for IC probing App 20050277323 - Eldridge, Benjamin N. ; et al.	2005-12-15
Probe card configuration for low mechanical flexural strength electrical routing substrates App 20050156611 - Shinde, Makarand S. ; et al.	2005-07-21
Probe card with coplanar daughter card App 20050140381 - Sporck, A. Nicholas ; et al.	2005-06-30
Probe card with coplanar daughter card Grant 6,856,150 - Sporck , et al. February 15, 2	2005-02-15
Probe card with coplanar daughter card App 20020145437 - Sporck, A. Nicholas ; et al.	2002-10-10

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