Shinbo; Kenichi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shinbo; Kenichi.The latest application filed is for "method and apparatus for mass spectrometry".

Company Profile

0.8.10

Shinbo; Kenichi - Yokohama JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method And Apparatus For Mass Spectrometry App 20110192970 - Oonishi; Fujio ; et al.	2011-08-11
Method and apparatus for mass spectrometry Grant 7,928,365 - Oonishi , et al. April 19, 2	2011-04-19
Data acquisition system Grant 7,890,074 - Shinbo , et al. February 15, 2	2011-02-15
Method and its apparatus for mass spectrometry Grant 7,476,850 - Oonishi , et al. January 13, 2	2009-01-13
Apparatus Diagnosing Method, Apparatus Diagnosis Module, And Apparatus Mounted With Apparatus Diagnosis Module App 20080244329 - SHINBO; Kenichi ; et al.	2008-10-02
Data Acquisition System App 20080073504 - Shinbo; Kenichi ; et al.	2008-03-27
Method and its apparatus for mass spectrometry App 20060289739 - Oonishi; Fujio ; et al.	2006-12-28
Method and apparatus for mass spectrometry App 20060248942 - Oonishi; Fujio ; et al.	2006-11-09
Narrow-directivity electromagnetic-field antenna probe, and electromagnetic-field measurement apparatus, electric-current distribution search-for apparatus or electrical-wiring diagnosis apparatus using this antenna probe Grant 7,132,997 - Uesaka , et al. November 7, 2	2006-11-07
Pulse generation circuit and semiconductor tester that uses the pulse generation circuit Grant 7,085,982 - Shinbo , et al. August 1, 2	2006-08-01
Test apparatus Grant 6,768,953 - Oonishi , et al. July 27, 2	2004-07-27
Narrow-directivity electromagnetic-field antenna probe, and electromagnetic-field measurement apparatus, electric-current distribution search-for apparatus or electrical-wiring diagnosis apparatus using this antenna probe App 20040135734 - Uesaka, Kouichi ; et al.	2004-07-15
Test apparatus Grant 6,697,755 - Oonishi , et al. February 24, 2	2004-02-24
Apparatus and method for detecting electromagnetic wave source, and method for analyzing the same Grant 6,617,860 - Uesaka , et al. September 9, 2	2003-09-09
Test apparatus App 20030167145 - Oonishi, Fujio ; et al.	2003-09-04
Pulse generation circuit and semiconductor tester that uses the pulse generation circuit App 20030140286 - Shinbo, Kenichi ; et al.	2003-07-24
Test apparatus App 20030040874 - Oonishi, Fujio ; et al.	2003-02-27
Apparatus and method for detecting electromagnetic wave source, and method for analyzing the same App 20020153904 - Uesaka, Kouichi ; et al.	2002-10-24

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.