| Patent | Date |
|---|
Semiconductor memory device and computer system including the same
Grant 9,298,612 - Shin , et al. March 29, 2 | 2016-03-29 |
Semiconductor memory device capable of performing refresh operation without auto refresh command
Grant 8,976,615 - Shin , et al. March 10, 2 | 2015-03-10 |
Semiconductor Memory Device And Computer System Including The Same
App 20140143478 - SHIN; Hyun-Sung ; et al. | 2014-05-22 |
Semiconductor Memory Device Capable Of Performing Refresh Operation Without Auto Refresh Command
App 20140078846 - SHIN; Hyun-Sung ; et al. | 2014-03-20 |
Tripod type constant velocity joint
Grant 8,298,092 - Cho , et al. October 30, 2 | 2012-10-30 |
Methods Of Booting Information Handling Systems And Information Handling Systems Performing The Same
App 20120191964 - LEE; JONG-MIN ; et al. | 2012-07-26 |
Method of testing a memory module and hub of the memory module
Grant 8,051,343 - Shin , et al. November 1, 2 | 2011-11-01 |
Tripod Type Constant Velocity Joint
App 20110159969 - CHO; JEONG HYUN ; et al. | 2011-06-30 |
Method of testing a memory module and hub of the memory module
App 20110113296 - Shin; Seung-Man ; et al. | 2011-05-12 |
Tripod type constant velocity joint
Grant 7,874,924 - Cho , et al. January 25, 2 | 2011-01-25 |
Method Optimizing Driving Voltage And Electronic System
App 20110001467 - CHOI; Hyung Chan ; et al. | 2011-01-06 |
Method of testing a memory module and hub of the memory module
Grant 7,849,373 - Shin , et al. December 7, 2 | 2010-12-07 |
Memory module, memory unit, and hub with non-periodic clock and methods of using the same
Grant 7,606,110 - Han , et al. October 20, 2 | 2009-10-20 |
Memory module test system for memory module including hub
Grant 7,539,910 - Ahn , et al. May 26, 2 | 2009-05-26 |
Methods and apparatus for interfacing between test system and memory
Grant 7,519,873 - Shin , et al. April 14, 2 | 2009-04-14 |
Method of testing a memory module and hub of the memory module
App 20090044062 - Shin; Seung-Man ; et al. | 2009-02-12 |
Memory module testing apparatus and method of testing memory modules
Grant 7,487,413 - Lee , et al. February 3, 2 | 2009-02-03 |
Method of testing a memory module and hub of the memory module
Grant 7,447,954 - Shin , et al. November 4, 2 | 2008-11-04 |
Hub for testing memory and methods thereof
Grant 7,343,533 - Lee , et al. March 11, 2 | 2008-03-11 |
Tripod Type Constant Velocity Joint
App 20080058107 - Cho; Jeong Hyun ; et al. | 2008-03-06 |
Test board for high-frequency system level test
Grant 7,233,157 - Lee , et al. June 19, 2 | 2007-06-19 |
Memory module and method thereof
App 20070030814 - Shin; Seung-Man ; et al. | 2007-02-08 |
Methods and apparatus for interfacing between test system and memory
App 20070022335 - Shin; Seung-Man ; et al. | 2007-01-25 |
Memory module testing apparatus and related method
App 20060230249 - Lee; Jung-kuk ; et al. | 2006-10-12 |
Hub for testing memory and methods thereof
App 20060107156 - Lee; Kee-Hoon ; et al. | 2006-05-18 |
Buffer for testing a memory module and method thereof
App 20060095817 - Lee; Kee-Hoon ; et al. | 2006-05-04 |
Method of testing memory module and memory module
App 20060064611 - Shin; Seung-Man ; et al. | 2006-03-23 |
Memory module, memory unit, and hub with non-periodic clock and methods of using the same
App 20060044927 - Han; You-Keun ; et al. | 2006-03-02 |
Method of testing a memory module and hub of the memory module
App 20060006419 - Shin; Seung-Man ; et al. | 2006-01-12 |
Method and apparatus for interfacing between test system and embedded memory on test mode setting operation
App 20050289287 - Shin, Seung-Man ; et al. | 2005-12-29 |
Test board for high-frequency system level test
App 20050258846 - Lee, Jung-Kuk ; et al. | 2005-11-24 |
Memory module test system
App 20050023560 - Ahn, Young-Man ; et al. | 2005-02-03 |
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