Shin; Kyeong-seon

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shin; Kyeong-seon.The latest application filed is for "test apparatus having multiple test sites at one handler and its test method".

Company Profile

0.14.14

Shin; Kyeong-seon - Yongin-si KR
Shin; Kyeong-Seon - Kyunggi-do KR
Shin; Kyeong-Seon - Gyeonggi-do KR
Shin; Kyeong-Seon - Kyungki-do KR
Shin; Kyeong-seon - Euiwang KR
Shin; Kyeong-seon - Youngin KR
Shin, Kyeong-Seon - Euiwang-City KR
Shin, Kyeong-Seon - Youngin-city KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Real-time optimized testing of semiconductor device Grant 7,689,876 - Chung , et al. March 30, 2	2010-03-30
Semiconductor device including fuse focus detector, fabricating method thereof and laser repair method using the fuse focus detector Grant 7,671,361 - Bang , et al. March 2, 2	2010-03-02
Method of testing semiconductor devices and handler used for testing semiconductor devices Grant 7,633,288 - Chung , et al. December 15, 2	2009-12-15
Test apparatus having multiple head boards at one handler and its test method Grant 7,602,172 - Chung , et al. October 13, 2	2009-10-13
Fuse regions of a semiconductor memory device and methods of fabricating the same Grant 7,492,032 - Bang , et al. February 17, 2	2009-02-17
Test Apparatus Having Multiple Test Sites At One Handler And Its Test Method App 20080197874 - CHUNG; Ae-Yong ; et al.	2008-08-21
Test system of semiconductor device having a handler remote control and method of operating the same Grant 7,408,339 - Chung , et al. August 5, 2	2008-08-05
Test apparatus having multiple test sites at one handler and its test method Grant 7,378,864 - Chung , et al. May 27, 2	2008-05-27
Real-time optimized testing of semiconductor device App 20080022167 - Chung; Ae-yong ; et al.	2008-01-24
Test System Of Semiconductor Device Having A Handler Remote Control And Method Of Operating The Same App 20070290707 - CHUNG; Ae-Yong ; et al.	2007-12-20
Test system of semiconductor device having a handler remote control and method of operating the same Grant 7,230,417 - Chung , et al. June 12, 2	2007-06-12
Semiconductor device including fuse focus detector, fabrication method thereof and laser repair method using the fuse detector App 20070126084 - Bang; Kwang-kyu ; et al.	2007-06-07
Method of testing semiconductor devices and handler used for testing semiconductor devices App 20070075719 - Chung; Ae-Yong ; et al.	2007-04-05
Test system of semiconductor device having a handler remote control and method of operating the same App 20060158211 - Chung; Ae-Yong ; et al.	2006-07-20
Semiconductor device with malfunction control circuit and controlling method thereof Grant 6,972,612 - Kang , et al. December 6, 2	2005-12-06
Method for electrical testing of semiconductor package that detects socket defects in real time Grant 6,960,908 - Chung , et al. November 1, 2	2005-11-01
Fuse regions of a semiconductor memory device and methods of fabricating the same App 20050236688 - Bang, Kwang-Kyu ; et al.	2005-10-27
Test apparatus having multiple test sites at one handler and its test method App 20050168236 - Chung, Ae-Yong ; et al.	2005-08-04
Method for testing a remnant batch of semiconductor devices Grant 6,922,050 - Chung , et al. July 26, 2	2005-07-26
Test apparatus having multiple test sites at one handler and its test method Grant 6,903,567 - Chung , et al. June 7, 2	2005-06-07
Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same Grant 6,861,682 - Bang , et al. March 1, 2	2005-03-01
Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell Grant 6,850,450 - Bang , et al. February 1, 2	2005-02-01
Method for testing a remnant batch of semiconductor devices App 20040253753 - Chung, Ae-yong ; et al.	2004-12-16
Method for electrical testing of semiconductor package that detects socket defects in real time App 20040207387 - Chung, Ae-yong ; et al.	2004-10-21
Test apparatus having multiple test sites at one handler and its test method App 20040061491 - Chung, Ae-Yong ; et al.	2004-04-01
Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same App 20030095451 - Bang, Jeong-Ho ; et al.	2003-05-22
Semiconductor device with malfunction control circuit and controlling method thereof App 20030065994 - Kang, Sang-Seok ; et al.	2003-04-03
Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell App 20030026147 - Bang, Kwang-Kyu ; et al.	2003-02-06

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