Patent | Date |
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Real-time optimized testing of semiconductor device Grant 7,689,876 - Chung , et al. March 30, 2 | 2010-03-30 |
Semiconductor device including fuse focus detector, fabricating method thereof and laser repair method using the fuse focus detector Grant 7,671,361 - Bang , et al. March 2, 2 | 2010-03-02 |
Method of testing semiconductor devices and handler used for testing semiconductor devices Grant 7,633,288 - Chung , et al. December 15, 2 | 2009-12-15 |
Test apparatus having multiple head boards at one handler and its test method Grant 7,602,172 - Chung , et al. October 13, 2 | 2009-10-13 |
Fuse regions of a semiconductor memory device and methods of fabricating the same Grant 7,492,032 - Bang , et al. February 17, 2 | 2009-02-17 |
Test Apparatus Having Multiple Test Sites At One Handler And Its Test Method App 20080197874 - CHUNG; Ae-Yong ;   et al. | 2008-08-21 |
Test system of semiconductor device having a handler remote control and method of operating the same Grant 7,408,339 - Chung , et al. August 5, 2 | 2008-08-05 |
Test apparatus having multiple test sites at one handler and its test method Grant 7,378,864 - Chung , et al. May 27, 2 | 2008-05-27 |
Real-time optimized testing of semiconductor device App 20080022167 - Chung; Ae-yong ;   et al. | 2008-01-24 |
Test System Of Semiconductor Device Having A Handler Remote Control And Method Of Operating The Same App 20070290707 - CHUNG; Ae-Yong ;   et al. | 2007-12-20 |
Test system of semiconductor device having a handler remote control and method of operating the same Grant 7,230,417 - Chung , et al. June 12, 2 | 2007-06-12 |
Semiconductor device including fuse focus detector, fabrication method thereof and laser repair method using the fuse detector App 20070126084 - Bang; Kwang-kyu ;   et al. | 2007-06-07 |
Method of testing semiconductor devices and handler used for testing semiconductor devices App 20070075719 - Chung; Ae-Yong ;   et al. | 2007-04-05 |
Test system of semiconductor device having a handler remote control and method of operating the same App 20060158211 - Chung; Ae-Yong ;   et al. | 2006-07-20 |
Semiconductor device with malfunction control circuit and controlling method thereof Grant 6,972,612 - Kang , et al. December 6, 2 | 2005-12-06 |
Method for electrical testing of semiconductor package that detects socket defects in real time Grant 6,960,908 - Chung , et al. November 1, 2 | 2005-11-01 |
Fuse regions of a semiconductor memory device and methods of fabricating the same App 20050236688 - Bang, Kwang-Kyu ;   et al. | 2005-10-27 |
Test apparatus having multiple test sites at one handler and its test method App 20050168236 - Chung, Ae-Yong ;   et al. | 2005-08-04 |
Method for testing a remnant batch of semiconductor devices Grant 6,922,050 - Chung , et al. July 26, 2 | 2005-07-26 |
Test apparatus having multiple test sites at one handler and its test method Grant 6,903,567 - Chung , et al. June 7, 2 | 2005-06-07 |
Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same Grant 6,861,682 - Bang , et al. March 1, 2 | 2005-03-01 |
Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell Grant 6,850,450 - Bang , et al. February 1, 2 | 2005-02-01 |
Method for testing a remnant batch of semiconductor devices App 20040253753 - Chung, Ae-yong ;   et al. | 2004-12-16 |
Method for electrical testing of semiconductor package that detects socket defects in real time App 20040207387 - Chung, Ae-yong ;   et al. | 2004-10-21 |
Test apparatus having multiple test sites at one handler and its test method App 20040061491 - Chung, Ae-Yong ;   et al. | 2004-04-01 |
Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same App 20030095451 - Bang, Jeong-Ho ;   et al. | 2003-05-22 |
Semiconductor device with malfunction control circuit and controlling method thereof App 20030065994 - Kang, Sang-Seok ;   et al. | 2003-04-03 |
Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell App 20030026147 - Bang, Kwang-Kyu ;   et al. | 2003-02-06 |