Shin; Koung-Su

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shin; Koung-Su.The latest application filed is for "apparatus and method for examining spectral characteristics of an object".

Company Profile

0.5.5

Shin; Koung-Su - Hwaseong-si KR
Shin; Koung-su - Suwon-si KR
Shin; Koung-Su - Suwon KR
Shin; Koung-Su - Kyungki-do KR
Shin, Koung-Su - Suwon-city KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus and method for examining spectral characteristics of transmitted light through an object Grant 7,646,478 - Shin , et al. January 12, 2	2010-01-12
Wafer inspection system and method thereof Grant 7,601,555 - Kim , et al. October 13, 2	2009-10-13
Method and apparatus for inspecting an edge exposure area of a wafer Grant 7,280,233 - Shin , et al. October 9, 2	2007-10-09
Systems and methods for measuring distance of semiconductor patterns Grant 7,274,471 - Shin , et al. September 25, 2	2007-09-25
Apparatus and method for examining spectral characteristics of an object App 20070188748 - Shin; Koung-Su ; et al.	2007-08-16
Wafer inspection system and method thereof App 20050282299 - Kim, Kwang-soo ; et al.	2005-12-22
Systems and methods for measuring distance of semiconductor patterns App 20050134867 - Shin, Koung-Su ; et al.	2005-06-23
Method of measuring a concentration of a material and method of measuring a concentration of a dopant of a semiconductor device Grant 6,815,236 - Kim , et al. November 9, 2	2004-11-09
Method and apparatus for inspecting an edge exposure area of a wafer App 20040169869 - Shin, Koung-Su ; et al.	2004-09-02
Method of measuring a concentration of a material and method of measuring a concentration of a dopant of a semiconductor device App 20040092046 - Kim, Tae-Kyoung ; et al.	2004-05-13

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