Shin; Kae Young

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shin; Kae Young.The latest application filed is for "method for verifying bad pattern in time series sensing data and apparatus thereof".

Company Profile

0.3.6

Shin; Kae Young - Yongin-si KR
SHIN; Kae Young - Seoul KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and apparatus for identifying root cause of defect using composite defect map Grant 9,665,795 - Shin , et al. May 30, 2	2017-05-30
Defect cell clustering method and apparatus thereof Grant 9,652,836 - Shin , et al. May 16, 2	2017-05-16
Method For Verifying Bad Pattern In Time Series Sensing Data And Apparatus Thereof App 20170060664 - SHIN; Kae Young ; et al.	2017-03-02
Method for verifying bad pattern in time series sensing data and apparatus thereof Grant 9,547,544 - Shin , et al. January 17, 2	2017-01-17
Method For Verifying Bad Pattern In Time Series Sensing Data And Apparatus Thereof App 20140372813 - SHIN; Kae Young ; et al.	2014-12-18
Method And Apparatus For Identifying Root Cause Of Defect Using Composite Defect Map App 20140355866 - SHIN; Kae Young ; et al.	2014-12-04
System And Method For Analyzing Sensed Data App 20140358487 - SHIN; Kae Young	2014-12-04
Yield Analysis System And Method Using Sensor Data Of Fabrication Equipment App 20140358465 - SHIN; Kae Young ; et al.	2014-12-04
Defect Cell Clustering Method And Apparatus Thereof App 20140358484 - SHIN; Kae Young ; et al.	2014-12-04

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