Shin; Hui-chong

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shin; Hui-chong.The latest application filed is for "memory system for supporting internal dq termination of data buffer".

Company Profile

3.7.10

Shin; Hui-chong - Seongnam-si KR
Shin; Hui-Chong - Seoul KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Memory system for supporting internal DQ termination of data buffer Grant 10,684,979 - Lim , et al.	2020-06-16
Memory System For Supporting Internal Dq Termination Of Data Buffer App 20200065289 - Lim; Sun-young ; et al.	2020-02-27
Memory system for supporting internal DQ termination of data buffer Grant 10,496,584 - Lim , et al. De	2019-12-03
Memory System For Supporting Internal Dq Termination Of Data Buffer App 20180329850 - Lim; Sun-young ; et al.	2018-11-15
Printed circuit board and memory module including the same Grant 9,520,160 - Yoon , et al. December 13, 2	2016-12-13
Printed Circuit Board And Memory Module Including The Same App 20140301125 - YOON; CHIL-NAM ; et al.	2014-10-09
Memory module packaging test system Grant 7,814,379 - Lee , et al. October 12, 2	2010-10-12
Memory module, memory unit, and hub with non-periodic clock and methods of using the same Grant 7,606,110 - Han , et al. October 20, 2	2009-10-20
Methods and apparatus for interfacing between test system and memory Grant 7,519,873 - Shin , et al. April 14, 2	2009-04-14
Memory module packaging test system App 20080016400 - Lee; Jung-kuk ; et al.	2008-01-17
Memory module and method thereof App 20070030814 - Shin; Seung-Man ; et al.	2007-02-08
Methods and apparatus for interfacing between test system and memory App 20070022335 - Shin; Seung-Man ; et al.	2007-01-25
Method of testing memory module and memory module App 20060064611 - Shin; Seung-Man ; et al.	2006-03-23
Memory module, memory unit, and hub with non-periodic clock and methods of using the same App 20060044927 - Han; You-Keun ; et al.	2006-03-02
Method and apparatus for interfacing between test system and embedded memory on test mode setting operation App 20050289287 - Shin, Seung-Man ; et al.	2005-12-29
Electronic system and refresh method Grant 6,883,061 - Seo , et al. April 19, 2	2005-04-19
Electronic system and refresh method App 20030145163 - Seo, Jong-Cheul ; et al.	2003-07-31

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