Shin; Heung Hyun
Patent Applications and Registrations
Patent applications and USPTO patent grants for Shin; Heung Hyun.The latest application filed is for "interferometer for tsv measurement and measurement method using same".
- Shin; Heung Hyun - Seoul N/A KR
| Patent | Date |
|---|---|
| Interferometer for TSV measurement and measurement method using same Grant 8,873,067 - Lee , et al. October 28, 2 | 2014-10-28 |
| Interferometer for TSV Measurement and Measurement Method Using Same App 20140036273 - Lee; Ki Hun ; et al. | 2014-02-06 |
| Plasma monitoring device and method Grant 8,416,293 - Shin , et al. April 9, 2 | 2013-04-09 |
| Plasma Monitoring Device And Method App 20100149326 - Shin; Heung Hyun ; et al. | 2010-06-17 |
| Detecting Materials On Wafer And Repair System And Method Thereof App 20100029019 - PARK; Heui Jae ; et al. | 2010-02-04 |
| Device For Processing Materials By Laser Beam App 20100006549 - Pahk; Heui Jae ; et al. | 2010-01-14 |
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