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Patent applications and USPTO patent grants for Shimoma; Goroku.The latest application filed is for "method and scanning electron microscope for measuring width of material on sample".
Patent | Date |
---|---|
Method and scanning electron microscope for measuring width of material on sample Grant 7,385,196 - Shimoma , et al. June 10, 2 | 2008-06-10 |
Method and scanning electron microscope for measuring width of material on sample App 20050006581 - Shimoma, Goroku ;   et al. | 2005-01-13 |
Method and scanning electron microscope for measuring dimension of material on sample Grant 6,791,084 - Shimoma , et al. September 14, 2 | 2004-09-14 |
Method and scanning electron microscope for measuring width of material on sample App 20030071214 - Shimoma, Goroku ;   et al. | 2003-04-17 |
Resolving power evaluation method and specimen for electron microscope Grant 6,166,380 - Kitagawa , et al. December 26, 2 | 2000-12-26 |
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