loadpatents
Patent applications and USPTO patent grants for Shimizu; Hiroya.The latest application filed is for "method for designing device, system for aiding to design device, and computer program product therefor".
Patent | Date |
---|---|
Fine pitch grid array type semiconductor device Grant 8,362,614 - Katagiri , et al. January 29, 2 | 2013-01-29 |
Inductance analysis system and method and program therefor Grant 7,823,096 - Katagiri , et al. October 26, 2 | 2010-10-26 |
Method for designing device, system for aiding to design device, and computer program product therefor Grant 7,681,154 - Katagiri , et al. March 16, 2 | 2010-03-16 |
Method For Designing Device, System For Aiding To Design Device, And Computer Program Product Therefor App 20080072194 - KATAGIRI; Mitsuaki ;   et al. | 2008-03-20 |
Semiconductor device, noise reduction method, and shield cover Grant 7,345,892 - Imazato , et al. March 18, 2 | 2008-03-18 |
Inductance analysis system and method and program therefor App 20070033553 - Katagiri; Mitsuaki ;   et al. | 2007-02-08 |
Semiconductor device Grant 7,119,446 - Shimizu , et al. October 10, 2 | 2006-10-10 |
Semiconductor device App 20060125078 - Shimizu; Hiroya ;   et al. | 2006-06-15 |
Fine pitch grid array type semiconductor device App 20060081972 - Katagiri; Mitsuaki ;   et al. | 2006-04-20 |
Semiconductor device Grant 7,030,478 - Shimizu , et al. April 18, 2 | 2006-04-18 |
Probe structure Grant 6,977,514 - Kohno , et al. December 20, 2 | 2005-12-20 |
Semiconductor device, noise reduction method, and shield cover App 20050270758 - Imazato, Masaharu ;   et al. | 2005-12-08 |
Method of manufacturing a semiconductor device Grant 6,955,870 - Kohno , et al. October 18, 2 | 2005-10-18 |
Testing apparatus for carrying out inspection of a semiconductor device Grant 6,952,110 - Kohno , et al. October 4, 2 | 2005-10-04 |
Semiconductor device App 20050184391 - Shimizu, Hiroya ;   et al. | 2005-08-25 |
Semiconductor device and test device for same Grant 6,885,208 - Miyatake , et al. April 26, 2 | 2005-04-26 |
Semiconductor device Grant 6,882,039 - Shimizu , et al. April 19, 2 | 2005-04-19 |
Packaging device for holding a plurality of semiconductor devices to be inspected Grant 6,864,568 - Kohno , et al. March 8, 2 | 2005-03-08 |
Semiconductor device testing apparatus and semiconductor device manufacturing method using it Grant 6,864,695 - Kohno , et al. March 8, 2 | 2005-03-08 |
Testing apparatus for carrying out inspection of a semiconductor device App 20050032252 - Kohno, Ryuji ;   et al. | 2005-02-10 |
Semiconductor device App 20050006751 - Shimizu, Hiroya ;   et al. | 2005-01-13 |
Semiconductor device testing apparatus and method for manufacturing the same Grant 6,828,810 - Kanamaru , et al. December 7, 2 | 2004-12-07 |
Semiconductor device Grant 6,784,533 - Shimizu , et al. August 31, 2 | 2004-08-31 |
Probe structure App 20040145382 - Kohno, Ryuji ;   et al. | 2004-07-29 |
Probe structure Grant 6,614,246 - Kohno , et al. September 2, 2 | 2003-09-02 |
Semiconductor device testing apparatus and method for manufacturing the same App 20030122550 - Kanamaru, Masatoshi ;   et al. | 2003-07-03 |
Method of manufacturing a semicondutor device App 20030104641 - Kohno, Ryuji ;   et al. | 2003-06-05 |
Semiconductor device and test device for same App 20030047731 - Miyatake, Toshio ;   et al. | 2003-03-13 |
Packaging device for holding a plurality of semiconductor devices to be inspected App 20030015779 - Kohno, Ryuji ;   et al. | 2003-01-23 |
Semiconductor device App 20020190336 - Shimizu, Hiroya ;   et al. | 2002-12-19 |
Semiconductor device App 20020047179 - Shimizu, Hiroya ;   et al. | 2002-04-25 |
Semiconductor device testing apparatus and semiconductor device manufacturing method using it App 20020033707 - Kohno, Ryuji ;   et al. | 2002-03-21 |
Semiconductor device App 20010000116 - Shimizu, Hiroya ;   et al. | 2001-04-05 |
Semiconductor device Grant 6,211,576 - Shimizu , et al. April 3, 2 | 2001-04-03 |
Memory module and an IC card Grant 5,838,549 - Nagata , et al. November 17, 1 | 1998-11-17 |
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