| Patent | Date |
|---|
Led Lamp Capable Of Freely Converting Color Temperature And Method For Converting Color Temperature Using The Same
App 20160341372 - SHIM; Hyun-Seop | 2016-11-24 |
LED lighting module using AC power
Grant 8,632,205 - Shim January 21, 2 | 2014-01-21 |
UV coating composition for LED color conversion
Grant 8,545,721 - Shim October 1, 2 | 2013-10-01 |
Radio frequency identification tag, and method of manufacturing the same
Grant 8,366,008 - Kim , et al. February 5, 2 | 2013-02-05 |
Uv Coating Composition For Led Color Conversion
App 20120313045 - Shim; Hyun-Seop | 2012-12-13 |
LED light converting resin composition and LED member using the same
Grant 8,310,771 - Shim November 13, 2 | 2012-11-13 |
Led Light Converting Resin Composition And Led Member Using The Same
App 20110317283 - Shim; Hyun-Seop | 2011-12-29 |
Dye-sensitized Solar Cells And Mobile Device Including The Same
App 20110061707 - KIM; Woon-Chun ; et al. | 2011-03-17 |
Display array substrate and method of manufacturing display substrate
App 20110061904 - Kim; Woon Chun ; et al. | 2011-03-17 |
Dye-sensitized Solar Cells And Mobile Device Including The Same
App 20110061727 - KIM; Woon-Chun ; et al. | 2011-03-17 |
Led Lighting Module Using Ac Power
App 20110043135 - Shim; Hyun-Seop | 2011-02-24 |
Radio Frequency Identification Tag, And Method Of Manufacturing The Same
App 20110042466 - KIM; Woon Chun ; et al. | 2011-02-24 |
Radio Frequency Identification Tag, And Method And Mold For Manufacturing The Same
App 20110043363 - Kim; Woon Chun ; et al. | 2011-02-24 |
Ac-powered Led Lighting System
App 20110031889 - Shim; Hyun-Seop | 2011-02-10 |
Led Lamp Device
App 20110006688 - Shim; Hyun-Seop | 2011-01-13 |
Multifunctional handler system for electrical testing of semiconductor devices
Grant 7,838,790 - Kang , et al. November 23, 2 | 2010-11-23 |
Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environments
Grant 7,554,349 - Kang , et al. June 30, 2 | 2009-06-30 |
Connector for testing a semiconductor package
Grant 7,438,563 - Chung , et al. October 21, 2 | 2008-10-21 |
Multifunctional handler system for electrical testing of semiconductor devices
App 20080110809 - Kang; Seong-goo ; et al. | 2008-05-15 |
Multichip package test
Grant 7,327,154 - Shin , et al. February 5, 2 | 2008-02-05 |
Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environments
App 20070236235 - Kang; Seong-goo ; et al. | 2007-10-11 |
Apparatus and method for performing parallel test on integrated circuit devices
Grant 7,227,351 - Kim , et al. June 5, 2 | 2007-06-05 |
Semiconductor testing apparatus and method of calibrating the same
App 20070101219 - Jang; Seung-Ho ; et al. | 2007-05-03 |
Test kit semiconductor package and method of testing semiconductor package using the same
App 20060187647 - Iy; Hyun-Guen ; et al. | 2006-08-24 |
Burn-in test apparatus for BGA packages using forced heat exhaust
Grant 7,084,655 - Min , et al. August 1, 2 | 2006-08-01 |
Connector for testing a semiconductor package
App 20060121757 - Chung; Young-Bae ; et al. | 2006-06-08 |
Test board of semiconductor tester having modified input/output printed circuit pattern and testing method using the same
App 20060085715 - Kim; Yong-Woon ; et al. | 2006-04-20 |
Contact-free test system for semiconductor device
App 20060076965 - An; Young-Soo ; et al. | 2006-04-13 |
Test kit for semiconductor package and method for testing semiconductor package using the same
Grant 7,017,428 - Min , et al. March 28, 2 | 2006-03-28 |
Multichip package test
App 20050258858 - Shin, Young-Gu ; et al. | 2005-11-24 |
Multichip package test
Grant 6,943,577 - Shin , et al. September 13, 2 | 2005-09-13 |
Burn-in test apparatus for BGA packages using forced heat exhaust
App 20050179457 - Min, Byung-Jun ; et al. | 2005-08-18 |
Apparatus and method for performing parallel test on integrated circuit devices
App 20050007140 - Kim, Woo-Il ; et al. | 2005-01-13 |
Multichip package test
App 20040119491 - Shin, Young-Gu ; et al. | 2004-06-24 |
Test kit for semiconductor package and method for testing semiconductor package using the same
App 20040112142 - Min, Byoung-Jun ; et al. | 2004-06-17 |
Parallel testing system for semiconductor memory devices
App 20030115519 - Kwon, Hyuk ; et al. | 2003-06-19 |
Test method for high speed memory devices in which limit conditions for the clock are defined
Grant 6,201,746 - Koo , et al. March 13, 2 | 2001-03-13 |
Test method of integrated circuit devices by using a dual edge clock technique
Grant 5,959,915 - Kwon , et al. September 28, 1 | 1999-09-28 |
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