Shikakura; Yoshiteru
Patent Applications and Registrations
Patent applications and USPTO patent grants for Shikakura; Yoshiteru.The latest application filed is for "scanning probe microscope and setting method thereof".
- Shikakura; Yoshiteru - Tokyo JP
- Shikakura; Yoshiteru - Chiba N/A JP
- Shikakura; Yoshiteru - Chiba-shi JP
| Patent | Date |
|---|---|
| Scanning probe microscope and setting method thereof Grant 11,391,755 - Shigeno , et al. July 19, 2 | 2022-07-19 |
| Scanning Probe Microscope And Setting Method Thereof App 20210293849 - SHIGENO; Masatsugu ; et al. | 2021-09-23 |
| Scanning probe microscope Grant 10,712,363 - Iwasa , et al. | 2020-07-14 |
| Scanning Probe Microscope App 20190234992 - IWASA; Masayuki ; et al. | 2019-08-01 |
| Scanning probe microscope and measurement range adjusting method for scanning probe microscope Grant 9,921,241 - Shigeno , et al. March 20, 2 | 2018-03-20 |
| Scanning Probe Microscope and Measurement Range Adjusting Method for Scanning Probe Microscope App 20160291053 - Shigeno; Masatsugu ; et al. | 2016-10-06 |
| Method for measuring vibration characteristic of cantilever Grant 9,354,248 - Shigeno , et al. May 31, 2 | 2016-05-31 |
| Method For Measuring Vibration Characteristic Of Cantilever App 20150276796 - SHIGENO; Masatsugu ; et al. | 2015-10-01 |
| Method of measuring vibration characteristics of cantilever Grant 8,615,811 - Shigeno , et al. December 24, 2 | 2013-12-24 |
| Probe aligning method for probe microscope and probe microscope operated by the same Grant 8,495,759 - Wakiyama , et al. July 23, 2 | 2013-07-23 |
| Method Of Measuring Vibration Characteristics Of Cantilever App 20120246768 - Shigeno; Masatsugu ; et al. | 2012-09-27 |
| Approach method for probe and sample in scanning probe microscope Grant 8,024,816 - Iyoki , et al. September 20, 2 | 2011-09-20 |
| Scanning probe microscope Grant 7,997,124 - Shikakura , et al. August 16, 2 | 2011-08-16 |
| Approach Method For Probe And Sample In Scanning Probe Microscope App 20100205697 - Iyoki; Masato ; et al. | 2010-08-12 |
| Probe Aligning Method For Probe Microscope And Probe Microscope Operated By The Same App 20100031402 - Wakiyama; Shigeru ; et al. | 2010-02-04 |
| Working method using scanning probe Grant 7,442,925 - Yasutake , et al. October 28, 2 | 2008-10-28 |
| Scanning probe microscope App 20070290130 - Shikakura; Yoshiteru ; et al. | 2007-12-20 |
| Processing method using atomic force microscope microfabrication device App 20070278177 - Kondo; Kazushige ; et al. | 2007-12-06 |
| Scanning probe microscope Grant 7,284,415 - Shikakura , et al. October 23, 2 | 2007-10-23 |
| Working method using scanning probe App 20060219901 - Yasutake; Masatoshi ; et al. | 2006-10-05 |
| Scanning probe microscope App 20050199046 - Shikakura, Yoshiteru ; et al. | 2005-09-15 |
| Method of operating scanning probe microscope Grant 6,596,992 - Ando , et al. July 22, 2 | 2003-07-22 |
| Scanning probe microscope App 20020088937 - Ando, Kazunori ; et al. | 2002-07-11 |
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