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name:-0.01457405090332
name:-0.012508153915405
name:-0.0032949447631836
Shikakura; Yoshiteru Patent Filings

Shikakura; Yoshiteru

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shikakura; Yoshiteru.The latest application filed is for "scanning probe microscope and setting method thereof".

Company Profile
2.13.12
  • Shikakura; Yoshiteru - Tokyo JP
  • Shikakura; Yoshiteru - Chiba N/A JP
  • Shikakura; Yoshiteru - Chiba-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Scanning probe microscope and setting method thereof
Grant 11,391,755 - Shigeno , et al. July 19, 2
2022-07-19
Scanning Probe Microscope And Setting Method Thereof
App 20210293849 - SHIGENO; Masatsugu ;   et al.
2021-09-23
Scanning probe microscope
Grant 10,712,363 - Iwasa , et al.
2020-07-14
Scanning Probe Microscope
App 20190234992 - IWASA; Masayuki ;   et al.
2019-08-01
Scanning probe microscope and measurement range adjusting method for scanning probe microscope
Grant 9,921,241 - Shigeno , et al. March 20, 2
2018-03-20
Scanning Probe Microscope and Measurement Range Adjusting Method for Scanning Probe Microscope
App 20160291053 - Shigeno; Masatsugu ;   et al.
2016-10-06
Method for measuring vibration characteristic of cantilever
Grant 9,354,248 - Shigeno , et al. May 31, 2
2016-05-31
Method For Measuring Vibration Characteristic Of Cantilever
App 20150276796 - SHIGENO; Masatsugu ;   et al.
2015-10-01
Method of measuring vibration characteristics of cantilever
Grant 8,615,811 - Shigeno , et al. December 24, 2
2013-12-24
Probe aligning method for probe microscope and probe microscope operated by the same
Grant 8,495,759 - Wakiyama , et al. July 23, 2
2013-07-23
Method Of Measuring Vibration Characteristics Of Cantilever
App 20120246768 - Shigeno; Masatsugu ;   et al.
2012-09-27
Approach method for probe and sample in scanning probe microscope
Grant 8,024,816 - Iyoki , et al. September 20, 2
2011-09-20
Scanning probe microscope
Grant 7,997,124 - Shikakura , et al. August 16, 2
2011-08-16
Approach Method For Probe And Sample In Scanning Probe Microscope
App 20100205697 - Iyoki; Masato ;   et al.
2010-08-12
Probe Aligning Method For Probe Microscope And Probe Microscope Operated By The Same
App 20100031402 - Wakiyama; Shigeru ;   et al.
2010-02-04
Working method using scanning probe
Grant 7,442,925 - Yasutake , et al. October 28, 2
2008-10-28
Scanning probe microscope
App 20070290130 - Shikakura; Yoshiteru ;   et al.
2007-12-20
Processing method using atomic force microscope microfabrication device
App 20070278177 - Kondo; Kazushige ;   et al.
2007-12-06
Scanning probe microscope
Grant 7,284,415 - Shikakura , et al. October 23, 2
2007-10-23
Working method using scanning probe
App 20060219901 - Yasutake; Masatoshi ;   et al.
2006-10-05
Scanning probe microscope
App 20050199046 - Shikakura, Yoshiteru ;   et al.
2005-09-15
Method of operating scanning probe microscope
Grant 6,596,992 - Ando , et al. July 22, 2
2003-07-22
Scanning probe microscope
App 20020088937 - Ando, Kazunori ;   et al.
2002-07-11

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