loadpatents
name:-0.013406991958618
name:-0.014737129211426
name:-0.0014519691467285
Shih; Hsueh-Hao Patent Filings

Shih; Hsueh-Hao

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shih; Hsueh-Hao.The latest application filed is for "semiconductor structure with through silicon via and method for fabricating and testing the same".

Company Profile
1.15.14
  • Shih; Hsueh-Hao - Hsinchu TW
  • Shih; Hsueh-Hao - Hsinchu City TW
  • Shih; Hsueh-Hao - Hsin-Chu TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Semiconductor structure with through silicon via and method for fabricating and testing the same
Grant 10,685,907 - Shih
2020-06-16
Semiconductor Structure With Through Silicon Via And Method For Fabricating And Testing The Same
App 20190273033 - Shih; Hsueh-Hao
2019-09-05
Semiconductor structure with through silicon via and method for fabricating and testing the same
Grant 10,340,203 - Shih
2019-07-02
Semiconductor Memory Device
App 20180286872 - Chen; Chien-Hung ;   et al.
2018-10-04
Semiconductor memory device
Grant 10,090,308 - Chen , et al. October 2, 2
2018-10-02
Nanowire structure and manufacturing method thereof
Grant 9,653,546 - Shih May 16, 2
2017-05-16
Nanowire Structure And Manufacturing Method Thereof
App 20160268376 - Shih; Hsueh-Hao
2016-09-15
Semiconductor capacitor
Grant 9,177,909 - Shih November 3, 2
2015-11-03
Semiconductor Structure With Through Silicon Via And Method For Fabricating And Testing The Same
App 20150228547 - Shih; Hsueh-Hao
2015-08-13
Semiconductor Capacitor
App 20150048482 - Shih; Hsueh-Hao
2015-02-19
Method for fabricating gate oxide
Grant RE40,113 - Tai , et al. February 26, 2
2008-02-26
Methods for reducing wordline sheet resistance
Grant 7,314,796 - Liu , et al. January 1, 2
2008-01-01
Topology-selective oxide CMP
App 20060252267 - Wang; Wai Shu ;   et al.
2006-11-09
Methods for reducing wordline sheet resistance
App 20060134863 - Liu; Hung-Wei ;   et al.
2006-06-22
Fabrication method for shallow trench isolation region
Grant 6,911,374 - Lin , et al. June 28, 2
2005-06-28
Method of manufacturing flash memory
Grant 6,887,757 - Chen , et al. May 3, 2
2005-05-03
Endpoint detection in manufacturing semiconductor device
App 20050084990 - Liu, Yuh-Turng ;   et al.
2005-04-21
[metal Silicide Structure And Method Of Forming The Same]
App 20050009337 - Liu, Hung-Wei ;   et al.
2005-01-13
[polishing Pad And Process Of Chemical Mechanical Use Thereof]
App 20040259480 - HUNG, YUNG-TAI ;   et al.
2004-12-23
Polishing pad and process of chemical mechanical use thereof
Grant 6,824,452 - Hung , et al. November 30, 2
2004-11-30
[method Of Manufacturing Flash Memory]
App 20040229435 - Chen, Kuang-Chao ;   et al.
2004-11-18
Method For Reducing Plasma Related Damages
App 20040209467 - WANG, SINCLAIR ;   et al.
2004-10-21
[fabrication Method For Shallow Trench Isolation Region]
App 20040203216 - LIN, CHIN HSIANG ;   et al.
2004-10-14
Method for removing fences without reduction of ONO film thickness
Grant 6,677,255 - Shih , et al. January 13, 2
2004-01-13
Method of forming borderless contact
Grant 6,281,143 - Huang , et al. August 28, 2
2001-08-28
Method Of Forming A Gate Oxide Layer
App 20010014483 - SHIH, HSUEH-HAO ;   et al.
2001-08-16
Method for fabricating gate oxide
Grant 6,121,095 - Tai , et al. September 19, 2
2000-09-19
Structure of an antenna effect monitor
Grant 5,959,311 - Shih , et al. September 28, 1
1999-09-28
Method for improving hot carrier degradation
Grant 5,920,782 - Shih , et al. July 6, 1
1999-07-06

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed