| Patent | Date |
|---|
Fatigue-free bipolar loop treatment to reduce imprint effect in piezoelectric device
Grant 11,456,330 - Shih , et al. September 27, 2 | 2022-09-27 |
Forming STI regions to separate semiconductor Fins
Grant 11,450,661 - Hsu , et al. September 20, 2 | 2022-09-20 |
Titanium Layer As Getter Layer For Hydrogen In A Mim Device
App 20220254871 - Shih; Chi-Yuan ; et al. | 2022-08-11 |
Titanium layer as getter layer for hydrogen in a MIM device
Grant 11,322,580 - Shih , et al. May 3, 2 | 2022-05-03 |
Reduction of electric field enhanced moisture penetration by metal shielding
Grant 11,289,568 - Shih , et al. March 29, 2 | 2022-03-29 |
Passivated and Faceted for Fin Field Effect Transistor
App 20220045214 - Chen; Yen-Yu ; et al. | 2022-02-10 |
Integration Scheme For Breakdown Voltage Enhancement Of A Piezoelectric Metal-insulator-metal Device
App 20210383972 - Lin; Anderson ; et al. | 2021-12-09 |
Passivated and faceted for fin field effect transistor
Grant 11,158,743 - Chen , et al. October 26, 2 | 2021-10-26 |
Integration scheme for breakdown voltage enhancement of a piezoelectric metal-insulator-metal device
Grant 11,107,630 - Lin , et al. August 31, 2 | 2021-08-31 |
Self-aligned passivation of active regions
Grant 10,943,995 - Wann , et al. March 9, 2 | 2021-03-09 |
Fatigue-free Bipolar Loop Treatment To Reduce Imprint Effect In Piezoelectric Device
App 20210043680 - Shih; Chi-Yuan ; et al. | 2021-02-11 |
Titanium Layer As Getter Layer For Hydrogen In A Mim Device
App 20210043721 - Shih; Chi-Yuan ; et al. | 2021-02-11 |
Electronic device including a capacitor
Grant 10,861,929 - Chang , et al. December 8, 2 | 2020-12-08 |
Integrated Heater (and Related Method) To Recover Degraded Piezoelectric Device Performance
App 20200098969 - Kalnitsky; Alexander ; et al. | 2020-03-26 |
Novel Integration Scheme For Breakdown Voltage Enhancement Of A Piezoelectric Metal-insulator-metal Device
App 20200098517 - Lin; Anderson ; et al. | 2020-03-26 |
System and method for test key characterizing wafer processing state
Grant 10,535,573 - Wann , et al. Ja | 2020-01-14 |
Electronic Device Including A Capacitor
App 20200006470 - CHANG; Kai-Fung ; et al. | 2020-01-02 |
Reduction Of Electric Field Enhanced Moisture Penetration By Metal Shielding
App 20200006469 - Shih; Chi-Yuan ; et al. | 2020-01-02 |
Passivated and Faceted for Fin Field Effect Transistor
App 20190363191 - Chen; Yen-Yu ; et al. | 2019-11-28 |
Passivated and faceted for fin field effect transistor
Grant 10,381,482 - Chen , et al. A | 2019-08-13 |
System and Method for Test Key Characterizing Wafer Processing State
App 20190237370 - Wann; Clement Hsingjen ; et al. | 2019-08-01 |
Self-Aligned Passivation of Active Regions
App 20190123179 - Wann; Clement Hsingjen ; et al. | 2019-04-25 |
System and method for test key characterizing wafer processing state
Grant 10,269,666 - Wann , et al. | 2019-04-23 |
Fin structure of semiconductor device
Grant 10,186,602 - Chen , et al. Ja | 2019-01-22 |
Self-aligned passivation of active regions
Grant 10,164,070 - Wann , et al. Dec | 2018-12-25 |
Self-aligned dual-metal silicide and germanide formation
Grant 10,115,597 - Tsai , et al. October 30, 2 | 2018-10-30 |
Self-Aligned Passivation of Active Regions
App 20180308955 - Wann; Clement Hsingjen ; et al. | 2018-10-25 |
Methods for Forming STI Regions in Integrated Circuits
App 20180247935 - Hsu; Chih-Yu ; et al. | 2018-08-30 |
Contact structure of semiconductor device
Grant 10,043,908 - Wann , et al. August 7, 2 | 2018-08-07 |
Self-aligned passivation of active regions
Grant 10,032,889 - Wann , et al. July 24, 2 | 2018-07-24 |
Methods for forming STI regions in integrated circuits
Grant 9,953,975 - Hsu , et al. April 24, 2 | 2018-04-24 |
Passivated and Faceted for Fin Field Effect Transistor
App 20170278971 - Chen; Yen-Yu ; et al. | 2017-09-28 |
Passivated and faceted fin field effect transistor
Grant 9,680,021 - Chen , et al. June 13, 2 | 2017-06-13 |
Self-Aligned Dual-Metal Silicide and Germanide Formation
App 20170140942 - Tsai; Chun Hsiung ; et al. | 2017-05-18 |
Methods for probing semiconductor fins through four-point probe and determining carrier concentrations
Grant 9,627,280 - Wann , et al. April 18, 2 | 2017-04-18 |
Self-aligned dual-metal silicide and germanide formation
Grant 9,559,182 - Wann , et al. January 31, 2 | 2017-01-31 |
Selective Fin-shaping process
Grant 9,553,025 - Wann , et al. January 24, 2 | 2017-01-24 |
Fin Structure of Semiconductor Device
App 20170018629 - Chen; Yen-Yu ; et al. | 2017-01-19 |
Passivation structure of fin field effect transistor
Grant 9,530,710 - Chen , et al. December 27, 2 | 2016-12-27 |
System and Method for Test Key Characterizing Wafer Processing State
App 20160372390 - Wann; Clement Hsingjen ; et al. | 2016-12-22 |
Method for fabricating fin field effect transistors
Grant 9,525,049 - Wann , et al. December 20, 2 | 2016-12-20 |
Self-Aligned Passivation of Active Regions
App 20160343832 - Wann; Clement Hsingjen ; et al. | 2016-11-24 |
Fin structure of semiconductor device
Grant 9,472,652 - Chen , et al. October 18, 2 | 2016-10-18 |
Fin field-effect transistors having controlled fin height
Grant 9,455,325 - Wann , et al. September 27, 2 | 2016-09-27 |
Methods for Probing Semiconductor Fins and Determining Carrier Concentrations
App 20160268174 - Wann; Clement Hsingjen ; et al. | 2016-09-15 |
Contact Structure Of Semiconductor Device
App 20160254383 - Wann; Clement Hsingjen ; et al. | 2016-09-01 |
System and method for test key characterizing wafer processing state
Grant 9,431,288 - Wann , et al. August 30, 2 | 2016-08-30 |
Self-aligned passivation of active regions
Grant 9,412,847 - Wann , et al. August 9, 2 | 2016-08-09 |
Contact structure of semiconductor device
Grant 9,379,108 - Wann , et al. June 28, 2 | 2016-06-28 |
Passivated and Faceted for Fin Field Effect Transistor
App 20160155846 - Chen; Yen-Yu ; et al. | 2016-06-02 |
Method For Fabricating Fin Field Effect Transistors
App 20160155826 - Wann; Clement Hsingjen ; et al. | 2016-06-02 |
Methods for probing semiconductor fins and determining carrier concentrations therein
Grant 9,349,659 - Wann , et al. May 24, 2 | 2016-05-24 |
Contact structure of semiconductor device
Grant 9,337,285 - Wann , et al. May 10, 2 | 2016-05-10 |
Self-Aligned Dual-Metal Silicide and Germanide Formation
App 20160099331 - Wann; Clement Hsingjen ; et al. | 2016-04-07 |
Passivated and faceted for fin field effect transistor
Grant 9,287,262 - Chen , et al. March 15, 2 | 2016-03-15 |
Method for fabricating fin field effect transistors
Grant 9,257,343 - Wann , et al. February 9, 2 | 2016-02-09 |
Contact Structure Of Semiconductor Device
App 20160005825 - Wann; Clement Hsingjen ; et al. | 2016-01-07 |
Self-aligned dual-metal silicide and germanide formation
Grant 9,214,556 - Wann , et al. December 15, 2 | 2015-12-15 |
Passivation Structure of Fin Field Effect Transistor
App 20150340302 - Chen; Yen-Yu ; et al. | 2015-11-26 |
Calculating Carrier Concentrations in Semiconductor Fins Using Probed Resistance
App 20150287652 - Wann; Clement Hsingjen ; et al. | 2015-10-08 |
Passivation structure of fin field effect transistor
Grant 9,142,474 - Chen , et al. September 22, 2 | 2015-09-22 |
Contact structure of semiconductor device
Grant 9,136,383 - Wann , et al. September 15, 2 | 2015-09-15 |
Contact Structure of Semiconductor Device
App 20150236016 - Wann; Clement Hsingjen ; et al. | 2015-08-20 |
Fin Field-effect Transistors Having Controlled Fin Height
App 20150228743 - WANN; Clement Hsingjen ; et al. | 2015-08-13 |
Calculating carrier concentrations in semiconductor Fins using probed resistance
Grant 9,093,335 - Wann , et al. July 28, 2 | 2015-07-28 |
Fin Structure of Semiconductor Device
App 20150179768 - Chen; Yen-Yu ; et al. | 2015-06-25 |
Contact structure of semiconductor device
Grant 9,048,317 - Wann , et al. June 2, 2 | 2015-06-02 |
Method of forming fin field-effect transistors having controlled fin height
Grant 9,041,158 - Wann , et al. May 26, 2 | 2015-05-26 |
Method For Fabricating Fin Field Effect Transistors
App 20150132912 - WANN; Clement Hsingjen ; et al. | 2015-05-14 |
Selective Fin-shaping Process
App 20150132911 - WANN; Clement Hsingjen ; et al. | 2015-05-14 |
Passivated and Faceted for Fin Field Effect Transistor
App 20150102386 - Chen; Yen-Yu ; et al. | 2015-04-16 |
Passivation Structure of Fin Field Effect Transistor
App 20150097239 - Chen; Yen-Yu ; et al. | 2015-04-09 |
System and Method for Test Key Characterizing Wafer Processing State
App 20150076499 - Wann; Clement Hsingjen ; et al. | 2015-03-19 |
Fin field effect transistors and methods for fabricating the same
Grant 8,963,257 - Wann , et al. February 24, 2 | 2015-02-24 |
Self-Aligned Dual-Metal Silicide and Germanide Formation
App 20150041918 - Wann; Clement Hsingjen ; et al. | 2015-02-12 |
Contact Structure of Semiconductor Device
App 20150035017 - Wann; Clement Hsingjen ; et al. | 2015-02-05 |
Selective fin-shaping process using plasma doping and etching for 3-dimensional transistor applications
Grant 8,946,829 - Wann , et al. February 3, 2 | 2015-02-03 |
Methods for Forming STI Regions in Integrated Circuits
App 20150021710 - Hsu; Chih-Yu ; et al. | 2015-01-22 |
Self-Aligned Passivation of Active Regions
App 20140256105 - Wann; Clement Hsingjen ; et al. | 2014-09-11 |
Method for Determining Carrier Concentrations in Semiconductor Fins
App 20140147943 - Wann; Clement Hsingjen ; et al. | 2014-05-29 |
Integrated chromatography devices and systems for monitoring analytes in real time and methods for manufacturing the same
Grant 8,721,892 - Shih , et al. May 13, 2 | 2014-05-13 |
Integrated Chromatography Devices And Systems For Monitoring Analytes In Real Time And Methods For Manufacturing The Same
App 20140048481 - Shih; Chi-Yuan ; et al. | 2014-02-20 |
Contact Structure Of Semiconductor Device
App 20140042500 - Wann; Clement Hsingjen ; et al. | 2014-02-13 |
Enhanced defect scanning
Grant 8,605,276 - Wu , et al. December 10, 2 | 2013-12-10 |
Overlay alignment mark and method of detecting overlay alignment error using the mark
Grant 8,592,287 - Shih , et al. November 26, 2 | 2013-11-26 |
Integrated chromatography devices and systems for monitoring analytes in real time and methods for manufacturing the same
Grant 8,574,432 - Shih , et al. November 5, 2 | 2013-11-05 |
Fin Field-effect Transistors Having Controlled Fin Height And Method Of Making
App 20130221491 - Wann; Clement Hsingjen ; et al. | 2013-08-29 |
Fin Field Effect Transistors And Methods For Fabricating The Same
App 20130119482 - WANN; Clement Hsingjen ; et al. | 2013-05-16 |
Enhanced Defect Scanning
App 20130107248 - Wu; Chih-Jen ; et al. | 2013-05-02 |
Selective Fin-shaping Process Using Plasma Doping And Etching For 3-dimensional Transistor Applications
App 20130093026 - WANN; Clement Hsingjen ; et al. | 2013-04-18 |
Overlay Alignment Mark And Method Of Detecting Overlay Alignment Error Using The Mark
App 20130032712 - SHIH; Chi-Yuan ; et al. | 2013-02-07 |
Structure of stacking scatterometry based overlay marks for marks footprint reduction
Grant 8,183,701 - Shih , et al. May 22, 2 | 2012-05-22 |
Method And Structure Of Stacking Scatterometry-based Overlay Or Cd Marks For Mark Footprint Reduction
App 20110024924 - Shih; Chi-Yuan ; et al. | 2011-02-03 |
Resonance-induced sensitivity enhancement method for conductivity sensors
Grant 7,629,797 - Tai , et al. December 8, 2 | 2009-12-08 |
On-chip temperature controlled liquid chromatography methods and devices
Grant 7,530,259 - Tai , et al. May 12, 2 | 2009-05-12 |
Resonance-induced Sensitivity Enhancement Method For Conductivity Sensors
App 20070247173 - Tai; Yu-Chong ; et al. | 2007-10-25 |
Integrated chromatography devices and systems for monitoring analytes in real time and methods for manufacturing the same
App 20070000838 - Shih; Chi-yuan ; et al. | 2007-01-04 |
Method and system for processing nanoparticles using a self assembly mechanism to form combined species
App 20060057597 - Tai; Yu-Chong ; et al. | 2006-03-16 |
On-chip temperature controlled liquid chromatography methods and devices
App 20050274174 - Tai, Yu-Chong ; et al. | 2005-12-15 |
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