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Method of inspecting process for manufacturing semiconductor device and method of manufacturing semiconductor device Grant 6,743,645 - Kubota , et al. June 1, 2 | 2004-06-01 |
Projection-type display apparatus App 20040070694 - Haruna, Fumio ;   et al. | 2004-04-15 |
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Method of inspecting process for manufacturing semiconductor device and method of manufacturing semiconductor device App 20020142498 - Kubota, Takeo ;   et al. | 2002-10-03 |
Polishing apparatus and method for planarizing layer on a semiconductor wafer Grant 5,948,205 - Kodera , et al. September 7, 1 | 1999-09-07 |
Polishing apparatus and method for planarizing layer on a semiconductor wafer Grant 5,914,275 - Kodera , et al. June 22, 1 | 1999-06-22 |
Method of and apparatus for cleaning workpiece Grant 5,860,181 - Maekawa , et al. January 19, 1 | 1999-01-19 |
Method for planarizing a semiconductor body by CMP method and an apparatus for manufacturing a semiconductor device using the method Grant 5,695,601 - Kodera , et al. December 9, 1 | 1997-12-09 |
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Polishing apparatus Grant 5,616,063 - Okumura , et al. April 1, 1 | 1997-04-01 |
Semiconductor planarizing apparatus Grant 5,597,341 - Kodera , et al. January 28, 1 | 1997-01-28 |
Method for planarizing a semiconductor device having a amorphous layer Grant 5,445,996 - Kodera , et al. August 29, 1 | 1995-08-29 |
Method and apparatus for polishing a workpiece Grant 5,398,459 - Okumura , et al. March 21, 1 | 1995-03-21 |