Shigekawa; Hidemi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shigekawa; Hidemi.The latest application filed is for "optical output system, measurement system, optical pump-probe scanning tunneling microscope system, computing device, program, and computing method".

Company Profile

0.5.6

Shigekawa; Hidemi - Tsukuba JP
SHIGEKAWA; Hidemi - Tsukuba-shi Ibaraki
Shigekawa; Hidemi - Ibaraki N/A JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Scanning probe microscope Grant 11,320,456 - Shigekawa May 3, 2	2022-05-03
Optical Output System, Measurement System, Optical Pump-probe Scanning Tunneling Microscope System, Computing Device, Program, And Computing Method App 20220026462 - SHIGEKAWA; Hidemi ; et al.	2022-01-27
Scanning Probe Microscope App 20210011052 - SHIGEKAWA; Hidemi	2021-01-14
Pump probe measuring device Grant 8,982,451 - Shigekawa , et al. March 17, 2	2015-03-17
Pump Probe Measuring Device App 20140240710 - Shigekawa; Hidemi ; et al.	2014-08-28
Pump probe measuring device and scanning probe microscope apparatus using the device Grant 7,961,379 - Shigekawa , et al. June 14, 2	2011-06-14
Pump Probe Measuring Device And Scanning Probe Microscope Apparatus Using The Device App 20100088787 - Shigekawa; Hidemi ; et al.	2010-04-08
Delay time modulation femtosecond time-resolved scanning probe microscope apparatus Grant 7,002,149 - Shigekawa , et al. February 21, 2	2006-02-21
Delay time modulation femtosecond time-resolved scanning probe microscope apparatus App 20050035288 - Shigekawa, Hidemi ; et al.	2005-02-17

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