SHIFRIN; MICHAEL
Patent Applications and Registrations
Patent applications and USPTO patent grants for SHIFRIN; MICHAEL.The latest application filed is for "tem-based metrology method and system".
- SHIFRIN; MICHAEL - ASHQELON IL
- SHIFRIN; MICHAEL - REHOVOT IL
- SHIFRIN; Michael - Cambridge MA
| Patent | Date |
|---|---|
| Tem-based Metrology Method And System App 20220310356 - MACHAVARIANI; VLADIMIR ; et al. | 2022-09-29 |
| Metrology method and system Grant 11,450,541 - Machavariani , et al. September 20, 2 | 2022-09-20 |
| Semiconductor Device Manufacture With In-line Hotspot Detection App 20220208620 - SHIFRIN; MICHAEL ; et al. | 2022-06-30 |
| TEM-based metrology method and system Grant 11,309,162 - Machavariani , et al. April 19, 2 | 2022-04-19 |
| Fcrn Antibody Compositions App 20210340251 - ZHANG; Zhongli ; et al. | 2021-11-04 |
| Tem-based Metrology Method And System App 20210217581 - MACHAVARIANI; VLADIMIR ; et al. | 2021-07-15 |
| TEM-based metrology method and system Grant 10,916,404 - Machavariani , et al. February 9, 2 | 2021-02-09 |
| Metrology Method And System App 20200294829 - MACHAVARIANI; VLADIMIR ; et al. | 2020-09-17 |
| Tem-based Metrology Method And System App 20190393016 - MACHAVARIANI; VLADIMIR ; et al. | 2019-12-26 |
| Lithographic patterning for sub-90nm with a multi-layered carbon-based hardmask Grant 7,803,715 - Haimson , et al. September 28, 2 | 2010-09-28 |
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