Shibuya; Hisae

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shibuya; Hisae.The latest application filed is for "optical condition determination system and optical condition determination method".

Company Profile

4.51.61

Shibuya; Hisae - Tokyo JP
Shibuya; Hisae - Chigasaki N/A JP
- Chigasaki JP
Shibuya; Hisae - Yokohama JP
Shibuya, Hisae - Chigasaki-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Optical condition determination system and optical condition determination method Grant 11,378,521 - Kasai , et al. July 5, 2	2022-07-05
Information processing apparatus, diagnosis method, and program Grant 10,977,568 - Shibuya , et al. April 13, 2	2021-04-13
Optical Condition Determination System And Optical Condition Determination Method App 20210072162 - Kasai; Hiroaki ; et al.	2021-03-11
Anomaly detecting method, and apparatus for the same Grant 9,940,184 - Shibuya April 10, 2	2018-04-10
Health management system, fault diagnosis system, health management method, and fault diagnosis method Grant 9,933,338 - Noda , et al. April 3, 2	2018-04-03
Anomaly diagnosis method and apparatus Grant 9,779,495 - Shibuya , et al. October 3, 2	2017-10-03
Facility state monitoring method and device for same Grant 9,659,250 - Shibuya , et al. May 23, 2	2017-05-23
Anomaly detection and diagnosis/prognosis method, anomaly detection and diagnosis/prognosis system, and anomaly detection and diagnosis/prognosis program Grant 9,483,049 - Maeda , et al. November 1, 2	2016-11-01
Anomaly Diagnosis System and Anomaly Diagnosis Method App 20160202693 - NODA; Toujirou ; et al.	2016-07-14
Anomaly Diagnosis Method and Apparatus App 20150363925 - SHIBUYA; Hisae ; et al.	2015-12-17
Information Processing Apparatus, Diagnosis Method, and Program App 20150220847 - SHIBUYA; Hisae ; et al.	2015-08-06
Facility Status Monitoring Method And Facility Status Monitoring Device App 20150213706 - Bai; Jie ; et al.	2015-07-30
Anomaly Detecting Method, And Apparatus For The Same App 20150169393 - SHIBUYA; Hisae	2015-06-18
Health Management System, Fault Diagnosis System, Health Management Method, And Fault Diagnosis Method App 20150160098 - NODA; Toujirou ; et al.	2015-06-11
Facility State Monitoring Method and Device for Same App 20140279795 - Shibuya; Hisae ; et al.	2014-09-18
Method and apparatus for inspecting patterns formed on a substrate Grant 8,824,774 - Sakai , et al. September 2, 2	2014-09-02
Anomaly Detection/Diagnostic Method and Anomaly Detection/Diagnostic System App 20140195184 - Maeda; Shunji ; et al.	2014-07-10
Method and device for monitoring the state of a facility Grant 8,682,824 - Shibuya , et al. March 25, 2	2014-03-25
Defect classification method and apparatus, and defect inspection apparatus Grant 8,660,340 - Shibuya , et al. February 25, 2	2014-02-25
Inspecting method and inspecting apparatus for substrate surface Grant 8,654,350 - Hamamatsu , et al. February 18, 2	2014-02-18
Method And Apparatus For Monitoring Equipment Conditions App 20140039834 - SHIBUYA; Hisae ; et al.	2014-02-06
Apparatus of inspecting defect in semiconductor and method of the same Grant 8,643,834 - Hamamatsu , et al. February 4, 2	2014-02-04
Error detection method and its system for early detection of errors in a planar or facilities Grant 8,630,962 - Maeda , et al. January 14, 2	2014-01-14
Visual inspection method and apparatus and image analysis system Grant 8,620,061 - Shibuya , et al. December 31, 2	2013-12-31
Visual inspection method and apparatus and image analysis system Grant 08620061 -	2013-12-31
Method And Apparatus For Inspecting Patterns Formed On A Substrate App 20130307963 - SAKAI; Kaoru ; et al.	2013-11-21
Anomaly Sensing and Diagnosis Method, Anomaly Sensing and Diagnosis System, Anomaly Sensing and Diagnosis Program and Enterprise Asset Management and Infrastructure Asset Management System App 20130282336 - Maeda; Shunji ; et al.	2013-10-24
Defect Classification Method And Apparatus, And Defect Inspection Apparatus App 20130202189 - Shibuya; Hisae ; et al.	2013-08-08
Malfunction Detection Method and System Thereof App 20130173218 - Maeda; Shunji ; et al.	2013-07-04
Method and apparatus for inspecting patterns formed on a substrate Grant 8,467,594 - Sakai , et al. June 18, 2	2013-06-18
Defect classification method and apparatus, and defect inspection apparatus Grant 8,437,534 - Shibuya , et al. May 7, 2	2013-05-07
Inspecting Method and Inspecting Apparatus For Substrate Surface App 20130107247 - Hamamatsu; Akira ; et al.	2013-05-02
Method For Anomaly Detection/diagnosis, System For Anomaly Detection/diagnosis, And Program For Anomaly Detection/diagnosis App 20130073260 - Maeda; Shunji ; et al.	2013-03-21
Apparatus Of Inspecting Defect In Semiconductor And Method Of The Same App 20130038862 - HAMAMATSU; Akira ; et al.	2013-02-14
Defect inspection apparatus and its method Grant 8,355,123 - Hamamatsu , et al. January 15, 2	2013-01-15
Anomaly Detection Method And Anomaly Detection System App 20120316835 - Maeda; Shunji ; et al.	2012-12-13
Method And Device For Monitoring The State Of A Facility App 20120290879 - Shibuya; Hisae ; et al.	2012-11-15
Failure Diagnosis System, Failure Diagnosis Device And Failure Diagnosis Program App 20120290497 - Magara; Hiroyuki ; et al.	2012-11-15
Apparatus of inspecting defect in semiconductor and method of the same Grant 8,310,666 - Hamamatsu , et al. November 13, 2	2012-11-13
Inspecting method and inspecting apparatus for substrate surface Grant 8,310,665 - Hamamatsu , et al. November 13, 2	2012-11-13
Method and apparatus for detecting pattern defects Grant 8,306,312 - Shibuya , et al. November 6, 2	2012-11-06
Equipment Status Monitoring Method, Monitoring System, And Monitoring Program App 20120271587 - Shibuya; Hisae ; et al.	2012-10-25
Anomaly Detection and Diagnosis/Prognosis Method, Anomaly Detection and Diagnosis/Prognosis System, and Anomaly Detection and Diagnosis/Prognosis Program App 20120166142 - Maeda; Shunji ; et al.	2012-06-28
Inspecting Method and Inspecting Apparatus for Substrate Surface App 20120162665 - Hamamatsu; Akira ; et al.	2012-06-28
Visual Inspection Method And Apparatus And Image Analysis System App 20120155741 - Shibuya; Hisae ; et al.	2012-06-21
Defect Inspection Apparatus And Its Method App 20120133927 - HAMAMATSU; Akira ; et al.	2012-05-31
Defect inspection apparatus and its method Grant 8,149,396 - Hamamatsu , et al. April 3, 2	2012-04-03
Inspecting method and inspecting apparatus for substrate surface Grant 8,144,337 - Hamamatsu , et al. March 27, 2	2012-03-27
Visual inspection method and apparatus and image analysis system Grant 8,139,841 - Shibuya , et al. March 20, 2	2012-03-20
Anomaly Detection Method and Anomaly Detection System App 20120041575 - Maeda; Shunji ; et al.	2012-02-16
Method and apparatus for analyzing defect data and a review system Grant 8,116,556 - Shibuya , et al. February 14, 2	2012-02-14
Method And Apparatus For Inspecting Patterns Formed On A Substrate App 20120002860 - SAKAI; Kaoru ; et al.	2012-01-05
Method for analyzing defect data and inspection apparatus and review system Grant 8,086,422 - Shibuya , et al. December 27, 2	2011-12-27
Method for analyzing defect data and inspection apparatus and review system Grant 8,027,527 - Shibuya , et al. September 27, 2	2011-09-27
Apparatus Of Inspecting Defect In Semiconductor And Method Of The Same App 20110228262 - Hamamatsu; Akira ; et al.	2011-09-22
Defect Inspection Apparatus and Its Method App 20110205534 - Hamamatsu; Akira ; et al.	2011-08-25
Error Detection Method And System App 20110191076 - Maeda; Shunji ; et al.	2011-08-04
Method And Apparatus For Detecting Pattern Defects App 20110164809 - Shibuya; Hisae ; et al.	2011-07-07
Apparatus of inspecting defect in semiconductor and method of the same Grant 7,952,699 - Hamamatsu , et al. May 31, 2	2011-05-31
Defect inspection apparatus and its method Grant 7,940,385 - Hamamatsu , et al. May 10, 2	2011-05-10
Method and apparatus for detecting pattern defects Grant 7,912,276 - Shibuya , et al. March 22, 2	2011-03-22
Method and Apparatus for Analyzing Defect Data and a Review System App 20110013825 - SHIBUYA; Hisae ; et al.	2011-01-20
Method and apparatus for inspecting a defect of a pattern Grant 7,848,563 - Sakai , et al. December 7, 2	2010-12-07
Apparatus Of Inspecting Defect In Semiconductor And Method Of The Same App 20100268482 - HAMAMATSU; Akira ; et al.	2010-10-21
Method and apparatus for analyzing defect data and a review system Grant 7,813,539 - Shibuya , et al. October 12, 2	2010-10-12
Method And Apparatus For Detecting Pattern Defects App 20100195896 - SHIBUYA; Hisae ; et al.	2010-08-05
Apparatus of inspecting defect in semiconductor and method of the same Grant 7,751,036 - Hamamatsu , et al. July 6, 2	2010-07-06
Method and apparatus for detecting pattern defects Grant 7,720,275 - Shibuya , et al. May 18, 2	2010-05-18
Method for evaluating color picture tubes and device for the same and method for making color picture tubes Grant 7,639,277 - Shibuya , et al. December 29, 2	2009-12-29
Inspecting Method and Inspecting Apparatus for Substrate Surface App 20090290168 - HAMAMATSU; Akira ; et al.	2009-11-26
Apparatus Of Inspecting Defect In Semiconductor And Method Of The Same App 20090153848 - Hamamatsu; Akira ; et al.	2009-06-18
Method For Analyzing Defect Data And Inspection Apparatus And Review System App 20090105990 - SHIBUYA; Hisae ; et al.	2009-04-23
Defect inspection apparatus and its method App 20090027664 - Hamamatsu; Akira ; et al.	2009-01-29
Apparatus of inspecting defect in semiconductor and method of the same Grant 7,474,394 - Hamamatsu , et al. January 6, 2	2009-01-06
Visual Inspection Method and Apparatus and Image Analysis System App 20080317329 - Shibuya; Hisae ; et al.	2008-12-25
Defect Classification Method And Apparatus, And Defect Inspection Apparatus App 20080075352 - SHIBUYA; HISAE ; et al.	2008-03-27
Apparatus of inspecting defect in semiconductor and method of the same App 20070019185 - Hamamatsu; Akira ; et al.	2007-01-25
Method for analyzing defect data and inspection apparatus and review system App 20060238755 - Shibuya; Hisae ; et al.	2006-10-26
Method for analyzing defect data and inspection apparatus and review system App 20060239536 - Shibuya; Hisae ; et al.	2006-10-26
Method and apparatus for inspection App 20060233434 - Hamamatsu; Akira ; et al.	2006-10-19
Method and apparatus for detecting pattern defects App 20060215902 - Shibuya; Hisae ; et al.	2006-09-28
Method for analyzing defect data and inspection apparatus and review system Grant 7,084,968 - Shibuya , et al. August 1, 2	2006-08-01
Method and apparatus for inspecting a defect of a pattern App 20060159330 - Sakai; Kaoru ; et al.	2006-07-20
Method and its apparatus for classifying defects App 20060078188 - Kurihara; Masaki ; et al.	2006-04-13
Method for analyzing defect data and inspection apparatus and review system App 20050168731 - Shibuya, Hisae ; et al.	2005-08-04
Method for analyzing defect data and inspection apparatus and review system Grant 6,876,445 - Shibuya , et al. April 5, 2	2005-04-05
Method and apparatus for analyzing composition of defects Grant 6,870,169 - Obara , et al. March 22, 2	2005-03-22
Method and apparatus for inspecting defects in a semiconductor wafer Grant 6,792,366 - Hosoya , et al. September 14, 2	2004-09-14
Method and apparatus for inspecting defects in a semiconductor wafer Grant 6,792,367 - Hosoya , et al. September 14, 2	2004-09-14
Method and apparatus for analyzing composition of defects App 20040126909 - Obara, Kenji ; et al.	2004-07-01
Method and apparatus for analyzing defect information Grant 6,741,941 - Obara , et al. May 25, 2	2004-05-25
Method and apparatus for analyzing defect data and a review system App 20040064269 - Shibuya, Hisae ; et al.	2004-04-01
Method and apparatus for inspecting defects in a semiconductor wafer App 20030109070 - Hosoya, Naoki ; et al.	2003-06-12
Method and apparatus for inspecting defects in a semiconductor wafer App 20030109952 - Hosoya, Naoki ; et al.	2003-06-12
Method for analyzing defect data and inspection apparatus and review system App 20020181756 - Shibuya, Hisae ; et al.	2002-12-05
Method for evaluating color picture tubes and device for the same and method for making color picture tubes App 20020047903 - Shibuya, Hisae ; et al.	2002-04-25

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