SHIBATA; Yukihiro
Patent Applications and Registrations
Patent applications and USPTO patent grants for SHIBATA; Yukihiro.The latest application filed is for "image forming apparatus that forms image according to instruction from remote location".
Company Profile
17.108.109
- SHIBATA; Yukihiro - Osaka JP
- Shibata; Yukihiro - Toyota JP
- SHIBATA; Yukihiro - Chigasaki-shi JP
- Shibata; Yukihiro - Tokyo JP
- SHIBATA; Yukihiro - Osaka-shi JP
- SHIBATA; Yukihiro - Toyota-shi JP
- Shibata; Yukihiro - Hanno JP
- Shibata; Yukihiro - Hanno-shi JP
- Shibata; Yukihiro - Fujisawa N/A JP
- Shibata; Yukihiro - Fukuoka-ken JP
- Shibata; Yukihiro - Kanagawa-ken JP
- Shibata; Yukihiro - Kitakyushu JP
- Shibata; Yukihiro - Fujisawa-shi JP
- Shibata; Yukihiro - Kitakyushu-shi JP
- Shibata; Yukihiro - Yokohama-shi JP
- Shibata; Yukihiro - Kangawa-ken JP
- Shibata; Yukihiro - Aichi-ken JP
- Shibata; Yukihiro - Anjo JP
- Shibata; Yukihiro - Yokohama JP
- Shibata; Yukihiro - Soraku-gun JP
- Shibata; Yukihiro - Kyoto JP
- Shibata; Yukihiro - Souraku JP
Patent Activity
| Patent | Date |
|---|---|
| Image Forming Apparatus That Forms Image According To Instruction From Remote Location App 20220291885 - SHIBATA; Yukihiro | 2022-09-15 |
| Manufacturing method for gas diffusion sheet Grant 11,444,297 - Shibata September 13, 2 | 2022-09-13 |
| Maintenance Apparatus For Cryocooler And Method For Maintaining Cryocooler App 20220163169 - Saitoh; Masamichi ; et al. | 2022-05-26 |
| Fuel cell separator Grant 11,069,905 - Seguchi , et al. July 20, 2 | 2021-07-20 |
| Defect inspection apparatus and pattern chip Grant 10,955,361 - Urano , et al. March 23, 2 | 2021-03-23 |
| Defect inspection device, pattern chip, and defect inspection method Grant 10,948,424 - Urano , et al. March 16, 2 | 2021-03-16 |
| Image forming apparatus Grant 10,838,672 - Shibata November 17, 2 | 2020-11-17 |
| Image forming apparatus Grant 10,754,596 - Okazaki , et al. A | 2020-08-25 |
| Image forming apparatus for executing print job Grant 10,684,803 - Shibata | 2020-06-16 |
| Defect Inspection Apparatus And Pattern Chip App 20200182804 - URANO; Yuta ; et al. | 2020-06-11 |
| Image Forming Apparatus App 20200174721 - SHIBATA; Yukihiro | 2020-06-04 |
| Image forming apparatus that makes a state transition to enter a power saving state Grant 10,656,702 - Shibata | 2020-05-19 |
| Manufacturing Method For Gas Diffusion Sheet App 20200119374 - SHIBATA; Yukihiro | 2020-04-16 |
| Image forming apparatus Grant 10,599,371 - Okazaki , et al. | 2020-03-24 |
| Manufacturing Method And Manufacturing Apparatus For Gas Diffusion Layer App 20200075962 - SHIBATA; Yukihiro ; et al. | 2020-03-05 |
| Image Forming Apparatus For Executing Print Job App 20200073599 - SHIBATA; Yukihiro | 2020-03-05 |
| Image Forming Apparatus App 20200019358 - Okazaki; Yusuke ; et al. | 2020-01-16 |
| Image forming apparatus Grant 10,536,588 - Shibata , et al. Ja | 2020-01-14 |
| Information processing device Grant 10,536,601 - Ohashi , et al. Ja | 2020-01-14 |
| Image Forming Apparatus App 20190324697 - OKAZAKI; Yusuke ; et al. | 2019-10-24 |
| Image Forming Apparatus App 20190297200 - SHIBATA; Yukihiro ; et al. | 2019-09-26 |
| Image Forming Apparatus And Management System App 20190297199 - SHIBATA; Yukihiro ; et al. | 2019-09-26 |
| Information Processing Device App 20190289155 - OHASHI; Akira ; et al. | 2019-09-19 |
| Image forming apparatus and management system Grant 10,412,239 - Shibata , et al. Sept | 2019-09-10 |
| Fuel Cell Separator App 20190190035 - SEGUCHI; Tsuyoshi ; et al. | 2019-06-20 |
| Semiconductor device and method of manufacturing the semiconductor device Grant 10,326,010 - Shibata , et al. | 2019-06-18 |
| Defect Inspection Device, Pattern Chip, And Defect Inspection Method App 20190107498 - URANO; Yuta ; et al. | 2019-04-11 |
| Image Forming Apparatus App 20190004589 - SHIBATA; Yukihiro | 2019-01-03 |
| Semiconductor Device And Method Of Manufacturing The Semiconductor Device App 20180182876 - Shibata; Yukihiro ; et al. | 2018-06-28 |
| Defect inspection method and its device Grant 9,976,966 - Shibata , et al. May 22, 2 | 2018-05-22 |
| Information processing device and information processing method Grant 9,935,988 - Shibata April 3, 2 | 2018-04-03 |
| Image forming apparatus comprising a punch mechanism forming a punch hole in a sheet on which an image is formed by an image forming unit Grant 9,922,275 - Shibata March 20, 2 | 2018-03-20 |
| Defect Inspection Method And Its Device App 20170102338 - SHIBATA; Yukihiro ; et al. | 2017-04-13 |
| Defect inspection method and device using same Grant 9,606,071 - Shibata , et al. March 28, 2 | 2017-03-28 |
| Image Forming Apparatus App 20170061264 - Shibata; Yukihiro | 2017-03-02 |
| Defect inspection device and defect inspection method Grant 9,523,648 - Urano , et al. December 20, 2 | 2016-12-20 |
| Defect inspection method and its device Grant 9,513,228 - Shibata , et al. December 6, 2 | 2016-12-06 |
| Defect Inspection Method And Device Using Same App 20160305893 - SHIBATA; Yukihiro ; et al. | 2016-10-20 |
| Defect inspection method and defect inspection device Grant 9,470,640 - Matsumoto , et al. October 18, 2 | 2016-10-18 |
| Manufacturing Method And Manufacturing Apparatus Of Gas Diffusion Layer For Fuel Cell App 20160254550 - SHIBATA; Yukihiro | 2016-09-01 |
| Defect Inspection Method And Defect Inspection Device App 20160161422 - MATSUMOTO; Shunichi ; et al. | 2016-06-09 |
| Image forming apparatus and image formation method having toner saving mode Grant 9,360,818 - Shibata June 7, 2 | 2016-06-07 |
| Defect inspection method and device using same Grant 9,329,137 - Shibata , et al. May 3, 2 | 2016-05-03 |
| Defect inspection method and defect inspection device Grant 9,310,318 - Urano , et al. April 12, 2 | 2016-04-12 |
| Defect inspection method and defect inspection device Grant 9,291,574 - Matsumoto , et al. March 22, 2 | 2016-03-22 |
| Defect inspection method and device thereof Grant 9,255,793 - Shibata , et al. February 9, 2 | 2016-02-09 |
| Defect inspection method and device therefor Grant 9,239,283 - Honda , et al. January 19, 2 | 2016-01-19 |
| Defect Inspection Method And Device Using Same App 20160011123 - SHIBATA; Yukihiro ; et al. | 2016-01-14 |
| Image Forming Apparatus And Image Formation Method Having Toner Saving Mode App 20150346667 - SHIBATA; Yukihiro | 2015-12-03 |
| Information Processing Device And Information Processing Method App 20150350269 - SHIBATA; Yukihiro | 2015-12-03 |
| Optical filtering device, defect inspection method and apparatus therefor Grant 9,182,592 - Ueno , et al. November 10, 2 | 2015-11-10 |
| Defect Inspection Method and Defect Inspection Device App 20150276623 - URANO; Yuta ; et al. | 2015-10-01 |
| Image Forming Apparatus App 20150277814 - Shibata; Yukihiro | 2015-10-01 |
| Defect Inspection Device and Defect Inspection Method App 20150241361 - Urano; Yuta ; et al. | 2015-08-27 |
| Defect inspecting apparatus and defect inspecting method Grant 8,970,836 - Taniguchi , et al. March 3, 2 | 2015-03-03 |
| Defect inspection method and device using same Grant 8,958,062 - Shibata , et al. February 17, 2 | 2015-02-17 |
| Defect Inspection Method And Its Device App 20150022806 - Shibata; Yukihiro ; et al. | 2015-01-22 |
| Defect inspection method and defect inspection apparatus Grant 8,922,764 - Urano , et al. December 30, 2 | 2014-12-30 |
| Defect inspection method and apparatus therefor Grant 8,885,037 - Taniguchi , et al. November 11, 2 | 2014-11-11 |
| Defect Inspection Method And Defect Inspection Device App 20140268122 - Matsumoto; Shunichi ; et al. | 2014-09-18 |
| Defect inspecting apparatus and defect inspecting method Grant 8,830,465 - Taniguchi , et al. September 9, 2 | 2014-09-09 |
| Defect Inspecting Apparatus and Defect Inspecting Method App 20140233024 - Taniguchi; Atsushi ; et al. | 2014-08-21 |
| Method of defect inspection and device of defect inspection Grant 8,804,112 - Shibata , et al. August 12, 2 | 2014-08-12 |
| Fault inspection device and fault inspection method Grant 8,804,110 - Urano , et al. August 12, 2 | 2014-08-12 |
| Optical Filtering Device, Defect Inspection Method and Apparatus Therefor App 20140160471 - Ueno; Taketo ; et al. | 2014-06-12 |
| Communication processing device that stores communication data in buffers, image forming apparatus, and method of communication processing Grant 8,751,702 - Shibata June 10, 2 | 2014-06-10 |
| Defect inspection method and device therefor Grant 8,711,347 - Honda , et al. April 29, 2 | 2014-04-29 |
| Dark-field defect inspecting method, dark-field defect inspecting apparatus, aberration analyzing method, and aberration analyzing apparatus Grant 8,681,328 - Taniguchi , et al. March 25, 2 | 2014-03-25 |
| Method and device for inspecting for defects Grant 8,670,116 - Nakao , et al. March 11, 2 | 2014-03-11 |
| Defect Inspection Method And Device Using Same App 20140009755 - Shibata; Yukihiro ; et al. | 2014-01-09 |
| Defect Inspection Method And Defect Inspection Apparatus App 20130301042 - Urano; Yuta ; et al. | 2013-11-14 |
| Defect Inspection Method And Device Therefor App 20130293879 - Honda; Toshifumi ; et al. | 2013-11-07 |
| Defect Testing Method And Device For Defect Testing App 20130293880 - Honda; Toshifumi ; et al. | 2013-11-07 |
| Communication Processing Device that Stores Communication Data in Buffers, Image Forming Apparatus, and Method of Communication Processing App 20130219089 - Shibata; Yukihiro | 2013-08-22 |
| Defect Inspecting Apparatus And Defect Inspecting Method App 20130188184 - Taniguchi; Atsushi ; et al. | 2013-07-25 |
| Method And Device For Inspecting For Defects App 20130155400 - Nakao; Toshiyuki ; et al. | 2013-06-20 |
| Fault Inspection Device And Fault Inspection Method App 20130141715 - Urano; Yuta ; et al. | 2013-06-06 |
| Cleaning method and method for manufacturing electronic device Grant 8,454,754 - Shibata , et al. June 4, 2 | 2013-06-04 |
| Defect Inspection Method And Device Therefor App 20130114078 - Honda; Toshifumi ; et al. | 2013-05-09 |
| Defect inspection apparatus and method Grant 8,416,292 - Shibata , et al. April 9, 2 | 2013-04-09 |
| Method and apparatus for inspecting defects Grant 8,416,402 - Shibata , et al. April 9, 2 | 2013-04-09 |
| Defect Inspection Method And Device Thereof App 20120296576 - Shibata; Yukihiro ; et al. | 2012-11-22 |
| Cleaning system and cleaning method Grant 8,303,797 - Hayamizu , et al. November 6, 2 | 2012-11-06 |
| Method And Apparatus For Inspecting Defects App 20120236296 - SHIBATA; Yukihiro ; et al. | 2012-09-20 |
| Apparatus for electrolyzing sulfuric acid, method of performing electrolysis, and apparatus for processing a substrate Grant 8,236,161 - Kobayashi , et al. August 7, 2 | 2012-08-07 |
| Apparatus for inspecting defects Grant 8,228,494 - Shibata , et al. July 24, 2 | 2012-07-24 |
| Method and apparatus for inspecting defects Grant 8,203,706 - Shibata , et al. June 19, 2 | 2012-06-19 |
| Defect Inspection Method And Apparatus App 20120128230 - Maeda; Shunji ; et al. | 2012-05-24 |
| Defect Inspection Method And Apparatus Therefor App 20120092484 - Taniguchi; Atsushi ; et al. | 2012-04-19 |
| Method Of Defect Inspection And Device Of Defect Inspection App 20120092657 - Shibata; Yukihiro ; et al. | 2012-04-19 |
| Method and apparatus for inspecting defects Grant 8,121,398 - Yoshitake , et al. February 21, 2 | 2012-02-21 |
| Defect inspection method and apparatus Grant 8,107,717 - Maeda , et al. January 31, 2 | 2012-01-31 |
| Polyelectrolyte material, method for producing polyelectrolyte material, polyelectrolyte component, fuel cell, and method for producing fuel cell Grant 8,105,728 - Hayamizu , et al. January 31, 2 | 2012-01-31 |
| Defect Inspection Method And Defect Inspection Apparatus App 20120019816 - Shibata; Yukihiro ; et al. | 2012-01-26 |
| Apparatus For Inspecting Defects App 20110292390 - Shibata; Yukihiro ; et al. | 2011-12-01 |
| Dark-field Defect Inspecting Method, Dark-field Defect Inspecting Apparatus, Aberration Analyzing Method, And Aberration Analyzing Apparatus App 20110286001 - Taniguchi; Atsushi ; et al. | 2011-11-24 |
| Apparatus for inspecting defects Grant 8,004,666 - Shibata , et al. August 23, 2 | 2011-08-23 |
| Defect Inspection Method And Apparatus App 20110170765 - MAEDA; Shunji ; et al. | 2011-07-14 |
| Defect Inspection Method and System App 20110075134 - UTO; Sachio ; et al. | 2011-03-31 |
| Defect inspection method and apparatus Grant 7,916,929 - Maeda , et al. March 29, 2 | 2011-03-29 |
| Defect inspection method and system Grant 7,859,656 - Uto , et al. December 28, 2 | 2010-12-28 |
| Apparatus and method for optical inspection Grant 7,826,047 - Shibata , et al. November 2, 2 | 2010-11-02 |
| Apparatus For Inspecting Defects App 20100208249 - Shibata; Yukihiro ; et al. | 2010-08-19 |
| Apparatus for inspecting defects Grant 7,714,997 - Shibata , et al. May 11, 2 | 2010-05-11 |
| Method And Apparatus For Inspecting Defects App 20090279079 - Shibata; Yukihiro ; et al. | 2009-11-12 |
| Method and Apparatus for Inspecting Defects App 20090257647 - Yoshitake; Yasuhiro ; et al. | 2009-10-15 |
| Method and its apparatus for inspecting defects Grant 7,599,545 - Shibata , et al. October 6, 2 | 2009-10-06 |
| Defect Inspection Apparatus And Method App 20090213215 - Shibata; Yukihiro ; et al. | 2009-08-27 |
| Defect Inspection Method And Apparatus App 20090214102 - Maeda; Shunji ; et al. | 2009-08-27 |
| Method and apparatus for detecting defects on a wafer Grant 7,567,343 - Ohshima , et al. July 28, 2 | 2009-07-28 |
| Method and Apparatus for Observing and Inspecting Defects App 20090141264 - Shibata; Yukihiro ; et al. | 2009-06-04 |
| Defect Inspection Method And System App 20090141269 - UTO; Sachio ; et al. | 2009-06-04 |
| Defect inspection method and apparatus Grant 7,512,259 - Maeda , et al. March 31, 2 | 2009-03-31 |
| Supported Catalyst, Method For Manufacturing Supported Catalyst, Fuel Cell, And Method For Manufacturing Fuel Cell App 20090081510 - Hayamizu; Naoya ; et al. | 2009-03-26 |
| Apparatus For Electrolyzing Sulfuric Acid, Method Of Performing Electrolysis, And Apparatus For Processing A Substrate App 20090078582 - Kobayashi; Nobuo ; et al. | 2009-03-26 |
| Supported Catalyst, Method For Manufacturing Supported Catalyst, Fuel Cell, And Method For Manufacturing Fuel Cell App 20090081515 - Shibata; Yukihiro ; et al. | 2009-03-26 |
| Method of inspecting defects Grant 7,508,973 - Okabe , et al. March 24, 2 | 2009-03-24 |
| Defect Inspection Method And Defect Inspection Apparatus App 20090059216 - Shibata; Yukihiro ; et al. | 2009-03-05 |
| Method and apparatus for observing and inspecting defects Grant 7,499,162 - Shibata , et al. March 3, 2 | 2009-03-03 |
| Defect inspection method and system Grant 7,492,452 - Uto , et al. February 17, 2 | 2009-02-17 |
| Method and apparatus for detecting defects of a sample using a dark field signal and a bright field signal Grant 7,463,350 - Nishiyama , et al. December 9, 2 | 2008-12-09 |
| Method and apparatus for detecting defects Grant 7,440,092 - Shibata , et al. October 21, 2 | 2008-10-21 |
| Polyelectrolyte Material, Method For Producing Polyelectrolyte Material, Polyelectrolyte Component, Fuel Cell, And Method For Producing Fuel Cell App 20080233452 - Hayamizu; Naoya ; et al. | 2008-09-25 |
| Method And Apparatus For Detecting Defects App 20080225286 - SHIBATA; Yukihiro ; et al. | 2008-09-18 |
| Cleaning Method And Method For Manufacturing Electronic Device App 20080196743 - SHIBATA; Yukihiro ; et al. | 2008-08-21 |
| Method and apparatus for detecting defects in a specimen utilizing information concerning the specimen Grant 7,400,393 - Shibata , et al. July 15, 2 | 2008-07-15 |
| Apparatus For Inspecting Defects App 20080144023 - Shibata; Yukihiro ; et al. | 2008-06-19 |
| Cleaning System And Cleaning Method App 20080110766 - Hayamizu; Naoya ; et al. | 2008-05-15 |
| Method and apparatus for inspecting defects and a system for inspecting defects Grant 7,372,561 - Shibata , et al. May 13, 2 | 2008-05-13 |
| Defect Inspection Method And Apparatus App 20080101685 - MAEDA; Shunji ; et al. | 2008-05-01 |
| Method and apparatus for inspecting pattern defects Grant 7,359,044 - Nishiyama , et al. April 15, 2 | 2008-04-15 |
| Solid Electrolyte Membrane, Method Of Manufacturing Solid Electrolyte Membrane, Fuel Cell Provided With Solid Electrolyte Membrane, And Method Of Manufacturing Fuel Cell App 20080076009 - Saito; Akiko ; et al. | 2008-03-27 |
| Substrate-processing Method And Method Of Manufacturing Electronic Device App 20080053478 - Shibata; Yukihiro ; et al. | 2008-03-06 |
| Systems for managing production information Grant 7,299,147 - Shibata , et al. November 20, 2 | 2007-11-20 |
| Defect inspection method and apparatus Grant 7,274,813 - Maeda , et al. September 25, 2 | 2007-09-25 |
| Method and apparatus for inspecting defects Grant 7,271,892 - Shibata , et al. September 18, 2 | 2007-09-18 |
| Defect Inspection Method And System App 20070206184 - Uto; Sachio ; et al. | 2007-09-06 |
| Defect inspection method and apparatus therefor Grant 7,251,024 - Maeda , et al. July 31, 2 | 2007-07-31 |
| Apparatus and method for optical inspection App 20070121106 - Shibata; Yukihiro ; et al. | 2007-05-31 |
| Systems for managing production information App 20070109534 - Shibata; Yukihiro ; et al. | 2007-05-17 |
| Method and apparatus for detecting defects on a wafer App 20070070337 - Ohshima; Yoshimasa ; et al. | 2007-03-29 |
| Method and apparatus for detecting defects App 20070064225 - Shibata; Yukihiro ; et al. | 2007-03-22 |
| Method and apparatus for detecting defects App 20070058164 - Shibata; Yukihiro ; et al. | 2007-03-15 |
| Method for inspecting defects and an apparatus of the same Grant 7,173,693 - Shibata , et al. February 6, 2 | 2007-02-06 |
| Method and apparatus for inspecting defects Grant 7,161,671 - Shibata , et al. January 9, 2 | 2007-01-09 |
| Method and apparatus for inspecting pattern defects App 20060290930 - Nishiyama; Hidetoshi ; et al. | 2006-12-28 |
| Method and apparatus for detecting defects Grant 7,142,294 - Shibata , et al. November 28, 2 | 2006-11-28 |
| Method and apparatus for observing and inspecting defects App 20060238760 - Shibata; Yukihiro ; et al. | 2006-10-26 |
| Method and apparatus for observing and inspecting defects Grant 7,092,095 - Shibata , et al. August 15, 2 | 2006-08-15 |
| Method and apparatus for inspecting defects App 20060078190 - Shibata; Yukihiro ; et al. | 2006-04-13 |
| Defect inspection method and apparatus App 20060038987 - Maeda; Shunji ; et al. | 2006-02-23 |
| Method and apparatus for inspecting pattern defects App 20060012780 - Nishiyama; Hidetoshi ; et al. | 2006-01-19 |
| Method and apparatus for inspecting defects and a system for inspecting defects App 20050264802 - Shibata, Yukihiro ; et al. | 2005-12-01 |
| Defect inspection method and apparatus Grant 6,947,587 - Maeda , et al. September 20, 2 | 2005-09-20 |
| Method for inspecting defects and an apparatus of the same App 20050128472 - Shibata, Yukihiro ; et al. | 2005-06-16 |
| Method and apparatus for inspecting defects of patterns App 20050110988 - Nishiyama, Hidetoshi ; et al. | 2005-05-26 |
| Defect inspection method and apparatus therefor App 20050083519 - Maeda, Shunji ; et al. | 2005-04-21 |
| Intake valve device Grant 6,874,466 - Shibata , et al. April 5, 2 | 2005-04-05 |
| Method and its apparatus for inspecting defects App 20050052642 - Shibata, Yukihiro ; et al. | 2005-03-10 |
| Method for inspecting defects and an apparatus for the same Grant 6,850,320 - Shibata , et al. February 1, 2 | 2005-02-01 |
| Intake valve device App 20050000488 - Shibata, Yukihiro ; et al. | 2005-01-06 |
| Method and apparatus for inspecting defects App 20040257560 - Shibata, Yukihiro ; et al. | 2004-12-23 |
| Method of inspecting defects App 20040228515 - Okabe, Takafumi ; et al. | 2004-11-18 |
| Defect inspection method and apparatus therefor Grant 6,819,416 - Maeda , et al. November 16, 2 | 2004-11-16 |
| Method and apparatus for observing and inspecting defects App 20040150821 - Shibata, Yukihiro ; et al. | 2004-08-05 |
| Method and apparatus for inspecting defects App 20040145734 - Shibata, Yukihiro ; et al. | 2004-07-29 |
| Method and apparatus for inspecting defects Grant 6,762,831 - Shibata , et al. July 13, 2 | 2004-07-13 |
| Method and apparatus for observing and inspecting defects Grant 6,690,469 - Shibata , et al. February 10, 2 | 2004-02-10 |
| Defect inspection method and apparatus therefor Grant 6,674,890 - Maeda , et al. January 6, 2 | 2004-01-06 |
| Apparatus and method for inspecting defects Grant 6,654,112 - Noguchi , et al. November 25, 2 | 2003-11-25 |
| Method and apparatus for inspecting defects in a patterned specimen Grant 6,621,571 - Maeda , et al. September 16, 2 | 2003-09-16 |
| Defect inspection method and apparatus therefor App 20030095251 - Maeda, Shunji ; et al. | 2003-05-22 |
| Method and apparatus for inspecting defects App 20030081201 - Shibata, Yukihiro ; et al. | 2003-05-01 |
| Defect inspection method and apparatus therefor Grant 6,556,290 - Maeda , et al. April 29, 2 | 2003-04-29 |
| Apparatus and method for inspecting defects App 20020154297 - Noguchi, Minori ; et al. | 2002-10-24 |
| Method and apparatus for detecting defects App 20020089664 - Shibata, Yukihiro ; et al. | 2002-07-11 |
| Defect inspection method and apparatus therefor App 20020030807 - Maeda, Shunji ; et al. | 2002-03-14 |
| Defect inspection method and apparatus therefor App 20020031248 - Maed, Shunji ; et al. | 2002-03-14 |
| Method for inspecting defects and an apparatus of the same App 20020027653 - Shibata, Yukihiro ; et al. | 2002-03-07 |
| Defect inspection method and apparatus therefor Grant 6,169,282 - Maeda , et al. January 2, 2 | 2001-01-02 |
| Storage construction for spare tire of motor vehicle Grant 6,132,162 - Kito , et al. October 17, 2 | 2000-10-17 |
| Automatic focus detection method, automatic focus detection apparatus, and inspection apparatus Grant 6,091,075 - Shibata , et al. July 18, 2 | 2000-07-18 |
| Pattern detecting method, pattern detecting apparatus, projection exposing apparatus using the same and exposure system Grant 5,684,565 - Oshida , et al. November 4, 1 | 1997-11-04 |
| Word processor with a handwriting text processing function Grant 5,614,926 - Shigematsu , et al. March 25, 1 | 1997-03-25 |
| Pen input processing apparatus Grant 5,583,543 - Takahashi , et al. December 10, 1 | 1996-12-10 |
| Data processor with rotatable display Grant 5,329,289 - Sakamoto , et al. July 12, 1 | 1994-07-12 |
| Illumination method, illumination apparatus and projection exposure apparatus Grant 5,302,999 - Oshida , et al. April 12, 1 | 1994-04-12 |
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