Shiau; Ying

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shiau; Ying.The latest application filed is for "apparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the same".

Company Profile

0.11.0

Shiau; Ying - San Jose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the same Grant 6,001,663 - Ling , et al. December 14, 1	1999-12-14
Arrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runs Grant 5,930,138 - Lin , et al. July 27, 1	1999-07-27
Method and apparatus for inspecting manufactured products for defects in response to in-situ monitoring Grant 5,896,294 - Chow , et al. April 20, 1	1999-04-20
Method and apparatus for automated wafer level testing and reliability data analysis Grant 5,822,717 - Tsiang , et al. October 13, 1	1998-10-13
Apparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the same Grant 5,821,765 - Ling , et al. October 13, 1	1998-10-13
Method and apparatus for pattern recognition of wafer test bins Grant 5,787,190 - Peng , et al. July 28, 1	1998-07-28
Arrangement and method for detecting sequential processing effects in manufacturing Grant 5,761,065 - Kittler , et al. June 2, 1	1998-06-02
Defect management system for productivity and yield improvement Grant 5,761,064 - La , et al. June 2, 1	1998-06-02
Watchdog system having data differentiating means for use in monitoring of semiconductor wafer testing line Grant 5,726,920 - Chen , et al. March 10, 1	1998-03-10
Arrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runs Grant 5,716,856 - Lin , et al. February 10, 1	1998-02-10
Real-time in-line defect disposition and yield forecasting system Grant 5,598,341 - Ling , et al. January 28, 1	1997-01-28

Company Registrations

SEC

0001301973

Shiau Ying

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