Sherry; Jeffrey C.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sherry; Jeffrey C..The latest application filed is for "self flattening test socket with anti-bowing and elastomer retention".

Company Profile

6.25.26

Sherry; Jeffrey C. - Savage MN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Electrically conductive pins for microcircuit tester Grant 10,877,090 - Nelson , et al. December 29, 2	2020-12-29
Self Flattening Test Socket With Anti-Bowing And Elastomer Retention App 20200400718 - Skodje; David T. ; et al.	2020-12-24
Self flattening test socket with anti-bowing and elastomer retention Grant 10,761,112 - Skodje , et al. Sep	2020-09-01
Electrically Conductive Kelvin Contacts For Microcircuit Tester App 20190302145 - Erdman; Joel N. ; et al.	2019-10-03
Electrically conductive pins microcircuit tester Grant 10,302,675 - Nelson , et al.	2019-05-28
Electrically conductive kelvin contacts for microcircuit tester Grant 10,247,755 - Erdman , et al.	2019-04-02
Electrically Conductive Pins Microcircuit Tester App 20190004091 - Nelson; John E. ; et al.	2019-01-03
Resilient interposer with electrically conductive slide-by pins as part of a microcircuit tester Grant 10,073,117 - Nelson , et al. September 11, 2	2018-09-11
Electrically Conductive Pins For Microcircuit Tester App 20170315169 - Nelson; John E. ; et al.	2017-11-02
Electrically Conductive Pins Microcircuit Tester App 20170276699 - Nelson; John E. ; et al.	2017-09-28
Electrically conductive pins for microcircuit tester Grant 9,678,106 - Nelson , et al. June 13, 2	2017-06-13
Electrically conductive pins for load boards lacking Kelvin capability for microcircuit testing Grant 9,606,143 - Sherry March 28, 2	2017-03-28
Electrically Conductive Kelvin Contacts For Microcircuit Tester App 20160320429 - Erdman; Joel N. ; et al.	2016-11-03
Electrically Conductive Pins Microcircuit Tester App 20160209444 - Nelson; John E. ; et al.	2016-07-21
Electrically conductive Kelvin contacts for microcircuit tester Grant 9,329,204 - Erdman , et al. May 3, 2	2016-05-03
Electrically conductive pins for microcircuit tester Grant 9,297,832 - Nelson , et al. March 29, 2	2016-03-29
Electrically Conductive Pins For Microcircuit Tester App 20150123689 - Nelson; John E. ; et al.	2015-05-07
Electrically conductive pins for microcircuit tester Grant 9,007,082 - Nelson , et al. April 14, 2	2015-04-14
Electrically conductive kelvin contacts for microcircuit tester Grant 8,988,090 - Erdman , et al. March 24, 2	2015-03-24
Microcircuit tester with slideable electrically conductive pins Grant 8,937,484 - Nelson , et al. January 20, 2	2015-01-20
Test contact system for testing integrated circuits with packages having an array of signal and power contacts Grant 8,912,811 - Sherry , et al. December 16, 2	2014-12-16
Electrically Conductive Pins For Microcircuit Tester App 20140266279 - Nelson; John E. ; et al.	2014-09-18
Electrically Conductive Kelvin Contacts For Microcircuit Tester App 20140103949 - Erdman; Joel N. ; et al.	2014-04-17
Electrically Conductive Pins For Microcircuit Tester App 20130271176 - Nelson; John E. ; et al.	2013-10-17
Electrically conductive Kelvin contacts for microcircuit tester Grant 8,558,554 - Erdman , et al. October 15, 2	2013-10-15
Electrically conductive pins for microcircuit tester Grant 8,536,889 - Nelson , et al. September 17, 2	2013-09-17
Electrically Conductive Pins For Microcircuit Tester App 20130154678 - Nelson; John E. ; et al.	2013-06-20
Electrically Conductive Kelvin Contacts For Microcircuit Tester App 20130099810 - Erdman; Joel N. ; et al.	2013-04-25
Microcircuit testing interface having kelvin and signal contacts within a single slot Grant 8,354,854 - Sherry January 15, 2	2013-01-15
Electrically Conductive Pins For Microcircuit Tester App 20130002285 - Nelson; John E. ; et al.	2013-01-03
Test Contact System For Testing Integrated Circuits With Packages Having An Array Of Signal and Power Contacts App 20120176151 - Sherry; Jeffrey C. ; et al.	2012-07-12
Electrically Conductive Kelvin Contacts For Microcircuit Tester App 20120092034 - Erdman; Joel N. ; et al.	2012-04-19
Electrically Conductive Pins For Microcircuit Tester App 20120062261 - Nelson; John E. ; et al.	2012-03-15
Test contact system for testing integrated circuits with packages having an array of signal and power contacts Grant 8,102,184 - Sherry , et al. January 24, 2	2012-01-24
Electrically Conductive Kelvin Contacts For Microcircuit Tester App 20100264935 - Erdman; Joel N. ; et al.	2010-10-21
Electrically Conductive Pins For Microcircuit Tester App 20100231251 - Nelson; John E. ; et al.	2010-09-16
Contact for use in testing integrated circuits Grant 7,737,708 - Sherry June 15, 2	2010-06-15
Microcircuit Testing Interface Having Kelvin And Signal Contacts Within A Single Slot App 20100134119 - Sherry; Jeffrey C.	2010-06-03
Test Contact System For Testing Integrated Circuits With Packages Having An Array Of Signal and Power Contacts App 20090302878 - Sherry; Jeffrey C. ; et al.	2009-12-10
Contact For Use In Testing Integrated Circuits App 20080006103 - Sherry; Jeffrey C.	2008-01-10
Test Contact System For Testing Integrated Circuits With Packages Having An Array Of Signal And Power Contacts App 20070202714 - Sherry; Jeffrey C.	2007-08-30

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