| Patent | Date |
|---|
Waveguide integrated circuit testing
Grant 11,360,117 - Sherry , et al. June 14, 2 | 2022-06-14 |
Waveguide integrated circuit testing
Grant 11,307,232 - Sherry , et al. April 19, 2 | 2022-04-19 |
Integrated circuit testing for integrated circuits with antennas
Grant 11,293,968 - Sherry April 5, 2 | 2022-04-05 |
Integrated circuit contactor for testing ICs and method of construction
Grant 11,209,458 - Nelson , et al. December 28, 2 | 2021-12-28 |
High isolation contactor with test pin and housing for integrated circuit testing
Grant 11,183,783 - Sherry , et al. November 23, 2 | 2021-11-23 |
Integrated Circuit Testing For Integrated Circuits With Antennas
App 20210356511 - Sherry; Jeffrey | 2021-11-18 |
High isolation housing for testing integrated circuits
Grant 11,002,760 - Sherry , et al. May 11, 2 | 2021-05-11 |
Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings
Grant 10,928,423 - DeBauche , et al. February 23, 2 | 2021-02-23 |
Integrated Circuit Contact Test Apparatus With And Method Of Construction
App 20210018533 - Sherry; Jeffrey ; et al. | 2021-01-21 |
Integrated Circuit Contactor For Testing ICs And Method Of Construction
App 20200363451 - Nelson; John ; et al. | 2020-11-19 |
Integrated circuit contact test apparatus with and method of construction
Grant 10,794,933 - Sherry , et al. October 6, 2 | 2020-10-06 |
High Isolation Contactor with Test Pin and Housing For Integrated Circuit Testing
App 20200313322 - Sherry; Jeffrey ; et al. | 2020-10-01 |
Integrated circuit contactor for testing ICs and method of construction
Grant 10,725,069 - Nelson , et al. | 2020-07-28 |
Waveguide integrated testing
Grant 10,698,000 - Sherry , et al. | 2020-06-30 |
High isolation contactor with test pin and housing for integrated circuit testing
Grant 10,686,269 - Sherry , et al. | 2020-06-16 |
Waveguide integrated testing
Grant 10,274,515 - Sherry , et al. | 2019-04-30 |
High Isolation Contactor with Test Pin and Housing For Integrated Circuit Testing
App 20190097333 - Sherry; Jeffrey ; et al. | 2019-03-28 |
Testing Apparatus And Method For Microcircuit Testing With Conical Bias Pad And Conductive Test Pin Rings
App 20190004093 - DeBauche; John ; et al. | 2019-01-03 |
Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings
Grant 10,067,164 - DeBauche , et al. September 4, 2 | 2018-09-04 |
Testing apparatus and method for microcircuit and wafer level IC testing
Grant 9,696,347 - DeBauche , et al. July 4, 2 | 2017-07-04 |
Testing Apparatus And Method For Microcircuit Testing With Conical Bias Pad And Conductive Test Pin Rings
App 20170059616 - DeBauche; John ; et al. | 2017-03-02 |
Electrically conductive kelvin contacts for microcircuit tester
Grant 9,500,673 - Erdman , et al. November 22, 2 | 2016-11-22 |
Thermal management for microcircuit testing system
Grant 9,476,936 - Johnson , et al. October 25, 2 | 2016-10-25 |
Testing Apparatus And Method For Microcircuit And Wafer Level Ic Testing
App 20150015287 - DeBauche; John ; et al. | 2015-01-15 |
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