Shemesh; Dror

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shemesh; Dror.The latest application filed is for "determination of defect location for examination of a specimen".

Company Profile

6.30.26

Shemesh; Dror - Hod Hasharon IL
Shemesh; Dror - Petah Tikva IL
Shemesh; Dror - Petach-Tikva IL
Shemesh; Dror - Rehovot IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Determination of defect location for examination of a specimen Grant 11,423,529 - Girmonsky , et al. August 23, 2	2022-08-23
Determination Of Defect Location For Examination Of A Specimen App 20210256687 - GIRMONSKY; Doron ; et al.	2021-08-19
X-ray Based Evaluation Of A Status Of A Structure Of A Substrate App 20210181128 - Shemesh; Dror	2021-06-17
Process monitoring Grant 11,022,565 - Shemesh , et al. June 1, 2	2021-06-01
X-ray based evaluation of a status of a structure of a substrate Grant 10,928,336 - Shemesh February 23, 2	2021-02-23
Method for detecting voids and an inspection system Grant 10,922,809 - Shemesh , et al. February 16, 2	2021-02-16
X-ray Based Evaluation Of A Status Of A Structure Of A Substrate App 20210033550 - Shemesh; Dror	2021-02-04
Process Monitoring App 20200355620 - Shemesh; Dror ; et al.	2020-11-12
Imaging of crystalline defects Grant 10,347,462 - Shemesh , et al. July 9, 2	2019-07-09
Imaging Of Crystalline Defects App 20190180975 - Shemesh; Dror ; et al.	2019-06-13
Method For Detecting Voids And An Inspection System App 20190043183 - Shemesh; Dror ; et al.	2019-02-07
Resolving ambiguities in an energy spectrum Grant 9,899,185 - Shemesh , et al. February 20, 2	2018-02-20
Method for detecting voids in interconnects and an inspection system Grant 9,805,909 - Shemesh , et al. October 31, 2	2017-10-31
System and method for scanning an object Grant 9,490,101 - Gronau , et al. November 8, 2	2016-11-08
System And Method For Scanning An Object App 20160276127 - Gronau; Yuval ; et al.	2016-09-22
Apparatus for sample formation and microanalysis in a vacuum chamber Grant 8,723,144 - Kidron , et al. May 13, 2	2014-05-13
Method and system for imaging a cross section of a specimen Grant 8,709,269 - Shemesh April 29, 2	2014-04-29
Method for monitoring chamber cleanliness Grant 8,361,814 - Shemesh , et al. January 29, 2	2013-01-29
Method And System For Enhancing Resolution Of A Scanning Electron Microscope App 20120241605 - Shemesh; Dror	2012-09-27
Method and system for providing a compensated auger spectrum Grant 7,912,657 - Shemesh , et al. March 22, 2	2011-03-22
Scanning electron microscope having multiple detectors and a method for multiple detector based imaging Grant 7,847,267 - Shemesh , et al. December 7, 2	2010-12-07
Charged particle detector assembly, charged particle beam apparatus and method for generating an image Grant 7,842,930 - Almogy , et al. November 30, 2	2010-11-30
Charged particle beam apparatus and method for operating a charged particle beam apparatus Grant 7,838,830 - Frosien , et al. November 23, 2	2010-11-23
Method and system for detecting hidden defects Grant 7,683,317 - Shemesh March 23, 2	2010-03-23
Method and system for generating and reviewing a thin sample Grant 7,659,506 - Avinun-Kalish , et al. February 9, 2	2010-02-09
Method And System For Generating And Reviewing A Thin Sample App 20090078867 - Avinun-Kalish; Michal ; et al.	2009-03-26
Method and System for Imaging a Cross Section of a Specimen App 20090053395 - Shemesh; Dror	2009-02-26
Specimen current mapper Grant 7,473,911 - Kadyshevitch , et al. January 6, 2	2009-01-06
Charged Particle Beam Apparatus And Method For Operating A Charged Particle Beam Apparatus App 20080258060 - FROSIEN; JUERGEN ; et al.	2008-10-23
Method and System for Providing a Compensated Auger Spectrum App 20080234962 - Shemesh; Dror ; et al.	2008-09-25
Charged Particle Detector Assembly, Charged Particle Beam Apparatus And Method For Generating An Image App 20080191134 - Almogy; Gilad ; et al.	2008-08-14
Methods and systems for process monitoring using x-ray emission Grant 7,365,320 - Shemesh April 29, 2	2008-04-29
Methods and systems for process monitoring using x-ray emission Grant 7,312,446 - Shemesh December 25, 2	2007-12-25
Method and apparatus for sample formation and microanalysis in a vacuum chamber Grant 7,297,965 - Kidron , et al. November 20, 2	2007-11-20
Method and device for aligning a charged particle beam column Grant 7,271,396 - Shemesh September 18, 2	2007-09-18
Multiple electrode lens arrangement and a method for inspecting an object Grant 7,233,008 - Petrov , et al. June 19, 2	2007-06-19
Method And System For Detecting Hidden Defects App 20070114404 - Shemesh; Dror	2007-05-24
Method And System For Enhancing Resolution Of A Scanning Electron Microscope App 20070090288 - Shemesh; Dror	2007-04-26
System and method for fast focal length alterations Grant 7,161,158 - Shemesh , et al. January 9, 2	2007-01-09
Method for monitoring chamber cleanliness App 20060216839 - Shemesh; Dror ; et al.	2006-09-28
Scanning electron microscope having multiple detectors and a method for multiple detector based imaging App 20060054814 - Shemesh; Dror ; et al.	2006-03-16
Methods and systems for process monitoring using x-ray emission App 20060054811 - Shemesh; Dror	2006-03-16
Methods and systems for process monitoring using x-ray emission App 20060049349 - Shemesh; Dror	2006-03-09
Method and apparatus for sample formation and microanalysis in a vacuum chamber App 20060011867 - Kidron; Eitan ; et al.	2006-01-19
Method and apparatus for sample formation and microanalysis in a vacuum chamber App 20060011868 - Kidron; Eitan ; et al.	2006-01-19
Apparatus and method for enhanced voltage contrast analysis Grant 6,900,065 - Rashkovan , et al. May 31, 2	2005-05-31
System and method for reducing charged particle contamination Grant 6,894,294 - Shemesh May 17, 2	2005-05-17
System and method for fast focal length alterations App 20050017192 - Shemesh, Dror ; et al.	2005-01-27
Specimen current mapper App 20040084622 - Kadyshevitch, Alexander ; et al.	2004-05-06
Apparatus and method for enhanced voltage contrast analysis App 20040075458 - Rashkovan, Vicky ; et al.	2004-04-22
System and method for reducing charged particle contamination App 20040046131 - Shemesh, Dror	2004-03-11
System and method for directing a miller Grant 6,670,610 - Shemesh , et al. December 30, 2	2003-12-30
System and method for directing a miller App 20030098416 - Shemesh, Dror ; et al.	2003-05-29