Shanks; Roy R.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Shanks; Roy R..The latest application filed is for "test wafer for diagnosing flaws in an integrated circuit fabrication process that cause a-c defects".
- Shanks; Roy R. - San Diego CA
| Patent | Date |
|---|---|
| Test wafer for diagnosing flaws in an integrated circuit fabrication process that cause A-C defects Grant 5,266,890 - Kumbasar , et al. November 30, 1 | 1993-11-30 |
| Controlled selective disconnect system for wafer scale integrated circuits Grant 4,329,685 - Mahon , et al. May 11, 1 | 1982-05-11 |
| Thin film memory device employing amorphous semiconductor materials Grant 4,203,123 - Shanks May 13, 1 | 1980-05-13 |
| Single transistor memory cell employing an amorphous semiconductor threshold device Grant 4,180,866 - Shanks December 25, 1 | 1979-12-25 |
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