loadpatents
name:-0.02951192855835
name:-0.022755861282349
name:-0.016899108886719
Shamma; Nader Patent Filings

Shamma; Nader

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shamma; Nader.The latest application filed is for "tin oxide films in semiconductor device manufacturing".

Company Profile
13.19.23
  • Shamma; Nader - Cupertino CA
  • Shamma; Nader - Los Altos CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Tin Oxide Films In Semiconductor Device Manufacturing
App 20220270877 - Yu; Jengyi ;   et al.
2022-08-25
Extreme Ultraviolet (euv) Lithography Using An Intervening Layer Or A Multi-layer Stack With Varying Mean Free Paths For Secondary Electron Generation
App 20220197147 - LIANG; Andrew ;   et al.
2022-06-23
Tin Oxide Films In Semiconductor Device Manufacturing
App 20220165571 - Yu; Jengyi ;   et al.
2022-05-26
Tin oxide films in semiconductor device manufacturing
Grant 11,322,351 - Yu , et al. May 3, 2
2022-05-03
Eliminating Yield Impact Of Stochastics In Lithography
App 20220122846 - Shamma; Nader ;   et al.
2022-04-21
Eliminating yield impact of stochastics in lithography
Grant 11,257,674 - Shamma , et al. February 22, 2
2022-02-22
Tin Oxide Films In Semiconductor Device Manufacturing
App 20210265163 - Yu; Jengyi ;   et al.
2021-08-26
Method of controlling a patterning process, lithographic apparatus, metrology apparatus lithographic cell and associated computer program
Grant 11,048,174 - Kubis , et al. June 29, 2
2021-06-29
Modification of SNO.sub.2 surface for EUV lithography
Grant 11,031,244 - Singhal , et al. June 8, 2
2021-06-08
Eliminating Yield Impact Of Stochastics In Lithography
App 20200402801 - Shamma; Nader ;   et al.
2020-12-24
Eliminating yield impact of stochastics in lithography
Grant 10,796,912 - Shamma , et al. October 6, 2
2020-10-06
Method Of Controlling A Patterning Process, Lithographic Apparatus, Metrology Apparatus Lithographic Cell And Associated Compute
App 20200233311 - KUBIS; Michael ;   et al.
2020-07-23
Etching substrates using ALE and selective deposition
Grant 10,685,836 - Tan , et al.
2020-06-16
Tin Oxide Films In Semiconductor Device Manufacturing
App 20200083044 - Yu; Jengyi ;   et al.
2020-03-12
Modification Of Sno2 Surface For Euv Lithography
App 20200058492 - Singhal; Akhil ;   et al.
2020-02-20
Tin oxide films in semiconductor device manufacturing
Grant 10,546,748 - Yu , et al. Ja
2020-01-28
Low roughness EUV lithography
Grant 10,438,807 - Wise , et al. O
2019-10-08
Etching Substrates Using Ale And Selective Deposition
App 20190244805 - Tan; Samantha ;   et al.
2019-08-08
Etching substrates using ale and selective deposition
Grant 10,269,566 - Tan , et al.
2019-04-23
Soft landing nanolaminates for advanced patterning
Grant 10,192,742 - Pasquale , et al. Ja
2019-01-29
Image reversal with AHM gap fill for multiple patterning
Grant 10,192,759 - Shamma , et al. Ja
2019-01-29
Eliminating Yield Impact Of Stochastics In Lithography
App 20180337046 - Shamma; Nader ;   et al.
2018-11-22
Tin Oxide Films In Semiconductor Device Manufacturing
App 20180240667 - Yu; Jengyi ;   et al.
2018-08-23
Low Roughness Euv Lithography
App 20180190503 - Wise; Richard ;   et al.
2018-07-05
Soft Landing Nanolaminates For Advanced Patterning
App 20180158683 - Pasquale; Frank L. ;   et al.
2018-06-07
Low roughness EUV lithography
Grant 9,922,839 - Wise , et al. March 20, 2
2018-03-20
Soft landing nanolaminates for advanced patterning
Grant 9,905,423 - Pasquale , et al. February 27, 2
2018-02-27
Etching Substrates Using Ale And Selective Deposition
App 20170316935 - Tan; Samantha ;   et al.
2017-11-02
PECVD films for EUV lithography
Grant 9,618,846 - Shamma , et al. April 11, 2
2017-04-11
Low Roughness Euv Lithography
App 20160379824 - Wise; Richard ;   et al.
2016-12-29
Soft Landing Nanolaminates For Advanced Patterning
App 20160293418 - Pasquale; Frank L. ;   et al.
2016-10-06
Image Reversal With Ahm Gap Fill For Multiple Patterning
App 20160254171 - Shamma; Nader ;   et al.
2016-09-01
Soft landing nanolaminates for advanced patterning
Grant 9,390,909 - Pasquale , et al. July 12, 2
2016-07-12
Pecvd Films For Euv Lithography
App 20160179005 - Shamma; Nader ;   et al.
2016-06-23
Method for forming a mask by etching conformal film on patterned ashable hardmask
Grant 9,362,133 - Shamma , et al. June 7, 2
2016-06-07
PECVD films for EUV lithography
Grant 9,304,396 - Shamma , et al. April 5, 2
2016-04-05
Soft Landing Nanolaminates For Advanced Patterning
App 20150126042 - Pasquale; Frank L. ;   et al.
2015-05-07
Pecvd Films For Euv Lithography
App 20140239462 - Shamma; Nader ;   et al.
2014-08-28
Image Reversal With Ahm Gap Fill For Multiple Patterning
App 20140170853 - Shamma; Nader ;   et al.
2014-06-19
Measurement of thin film properties using plasmons
App 20050057754 - Smith, David E. A. ;   et al.
2005-03-17
Method and apparatus for determining a feature-forming variant of a lithographic system
Grant 5,331,370 - Rosner , et al. July 19, 1
1994-07-19
Method of making a mask for proximity effect correction in projection lithography
Grant 5,208,124 - Sporon-Fiedler , et al. May 4, 1
1993-05-04

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