Shalmoni; Hadar
Patent Applications and Registrations
Patent applications and USPTO patent grants for Shalmoni; Hadar.The latest application filed is for "symmetric target design in scatterometry overlay metrology".
- Shalmoni; Hadar - Beit Oved IL
| Patent | Date |
|---|---|
| Symmetric target design in scatterometry overlay metrology Grant 10,591,406 - Bringoltz , et al. | 2020-03-17 |
| Symmetric target design in scatterometry overlay metrology Grant 9,739,702 - Bringoltz , et al. August 22, 2 | 2017-08-22 |
| Phase characterization of targets Grant 9,581,430 - Manassen , et al. February 28, 2 | 2017-02-28 |
| Symmetric Target Design In Scatterometry Overlay Metrology App 20160216197 - Bringoltz; Barak ; et al. | 2016-07-28 |
| Symmetric Target Design In Scatterometry Overlay Metrology App 20150204664 - Bringoltz; Barak ; et al. | 2015-07-23 |
| Phase Characterization Of Targets App 20140111791 - Manassen; Amnon ; et al. | 2014-04-24 |
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