Seya; Eiichi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Seya; Eiichi.The latest application filed is for "method and apparatus for specimen fabrication".
- Seya; Eiichi - Kunitachi N/A JP
- Seya; Eiichi - Hitachinaka JP
- Seya; Eiichi - Hachioji JP
| Patent | Date |
|---|---|
| Method and apparatus for specimen fabrication Grant 8,796,651 - Shichi , et al. August 5, 2 | 2014-08-05 |
| Method and apparatus for specimen fabrication App 20110114476 - Shichi; Hiroyasu ; et al. | 2011-05-19 |
| Method and apparatus for specimen fabrication Grant 7,897,936 - Shichi , et al. March 1, 2 | 2011-03-01 |
| Stage mechanism, electron microscope having the stage mechanism and method of controlling positioning of stage mechanism Grant 7,791,043 - Seya , et al. September 7, 2 | 2010-09-07 |
| Stage And Electron Microscope Apparatus App 20090236540 - SEYA; Eiichi ; et al. | 2009-09-24 |
| Scanning electron microscope Grant 7,514,683 - Tanii , et al. April 7, 2 | 2009-04-07 |
| Scanning Electron Microscope App 20080217534 - SEYA; Eiichi | 2008-09-11 |
| Stage Mechanism, Electron Microscope Having the Stage Mechanism and Method of Controlling Positioning of Stage Mechanism App 20080211349 - Seya; Eiichi ; et al. | 2008-09-04 |
| Method and apparatus for specimen fabrication App 20080191151 - Shichi; Hiroyasu ; et al. | 2008-08-14 |
| Scanning electron microscope App 20070235646 - Tanii; Kazuma ; et al. | 2007-10-11 |
| Method and apparatus for specimen fabrication Grant 7,268,356 - Shichi , et al. September 11, 2 | 2007-09-11 |
| Two axis state for microscope Grant 6,943,945 - Nakagawa , et al. September 13, 2 | 2005-09-13 |
| Two axis stage for microscope App 20050018284 - Nakagawa, Shuichi ; et al. | 2005-01-27 |
| Method and apparatus for specimen fabrication App 20050006600 - Shichi, Hiroyasu ; et al. | 2005-01-13 |
| Method and apparatus for specimen fabrication Grant 6,794,663 - Shichi , et al. September 21, 2 | 2004-09-21 |
| Method and apparatus for specimen fabrication App 20040089821 - Shichi, Hiroyasu ; et al. | 2004-05-13 |
| Method and apparatus for specimen fabrication Grant 6,664,552 - Shichi , et al. December 16, 2 | 2003-12-16 |
| Method and apparatus for specimen fabrication App 20020079463 - Shichi, Hiroyasu ; et al. | 2002-06-27 |
| Wafer transport method Grant 5,601,686 - Kawamura , et al. February 11, 1 | 1997-02-11 |
| Wafer transport method Grant 5,562,800 - Kawamura , et al. October 8, 1 | 1996-10-08 |
| Methods for measuring optical system, and method and apparatus for exposure using said measuring method Grant 5,420,436 - Seya , et al. May 30, 1 | 1995-05-30 |
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