Seuring; Markus

Patent Applications and Registrations

Patent applications and USPTO patent grants for Seuring; Markus.The latest application filed is for "test apparatus for generating reference scan chain test data and test system".

Company Profile

0.9.9

Seuring; Markus - Stuttgart N/A DE
Seuring; Markus - Dresden DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Test apparatus for generating reference scan chain test data and test system Grant 9,885,752 - Seuring , et al. February 6, 2	2018-02-06
Test Apparatus For Generating Reference Scan Chain Test Data And Test System App 20160356847 - SEURING; Markus ; et al.	2016-12-08
Apparatus for determining a number of successive equal bits preceding an edge within a bit stream and apparatus for reconstructing a repetitive bit sequence Grant 9,164,726 - Rivoir , et al. October 20, 2	2015-10-20
Apparatus For Determining A Number Of Successive Equal Bits Preceding An Edge Within A Bit Stream And Apparatus For Reconstructing A Repetitive Bit Sequence App 20130198252 - Rivoir; Jochen ; et al.	2013-08-01
At-speed bitmapping in a memory built-in self-test by locking an N-TH failure Grant 8,307,249 - Seuring , et al. November 6, 2	2012-11-06
At-speed Bitmapping In A Memory Built-in Self-test By Locking An N-th Failure App 20100223511 - Seuring; Markus ; et al.	2010-09-02
Multicore chip test Grant 7,689,884 - Seuring March 30, 2	2010-03-30
Storing multicore chip test data Grant 7,673,208 - Seuring March 2, 2	2010-03-02
Test algorithm selection in memory built-in self test controller Grant 7,653,845 - Hesse , et al. January 26, 2	2010-01-26
Multicore chip test App 20080148117 - Seuring; Markus	2008-06-19
Storing multicore chip test data App 20080148120 - Seuring; Markus	2008-06-19
Technique for combining scan test and memory built-in self test Grant 7,340,658 - Seuring March 4, 2	2008-03-04
Test algorithm selection in memory built-in self test controller App 20070204190 - Hesse; Siegfried Kay ; et al.	2007-08-30
Technique for combining scan test and memory built-in self test App 20050204232 - Seuring, Markus	2005-09-15

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