loadpatents
Patent applications and USPTO patent grants for Seubert; Ronald C..The latest application filed is for "reference slide".
Patent | Date |
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Device, system, and method for selecting a target analyte Grant 11,402,301 - Quarre , et al. August 2, 2 | 2022-08-02 |
Device, system, and method for selecting a target analyte Grant 11,231,344 - Nordberg , et al. January 25, 2 | 2022-01-25 |
Reference Slide App 20210129134 - CAMPTON; Daniel E. ;   et al. | 2021-05-06 |
Detecting a substrate Grant 10,962,362 - Varshavskaya , et al. March 30, 2 | 2021-03-30 |
Device, System, And Method For Selecting A Target Analyte App 20200284698 - QUARRE; Steve ;   et al. | 2020-09-10 |
Device, System, And Method For Selecting A Target Analyte App 20190360899 - NORDBERG; Joshua ;   et al. | 2019-11-28 |
Detecting A Substrate App 20180372489 - VARSHAVSKAYA; Paulina ;   et al. | 2018-12-27 |
Detecting a substrate Grant 10,072,927 - Varshavskaya , et al. September 11, 2 | 2018-09-11 |
Apparatus, System, And Method For Collecting A Target Material App 20180196032 - CAMPTON; Daniel E. ;   et al. | 2018-07-12 |
Systems And Methods For Separation And Analysis Of Target Analytes App 20130280146 - Seubert; Ronald C. ;   et al. | 2013-10-24 |
Systems and methods for harvesting target particles of a suspension Grant 8,445,264 - Seubert , et al. May 21, 2 | 2013-05-21 |
Systems And Methods For Isolating And Characterizing Target Materials Of A Suspension App 20130034841 - Seubert; Ronald C. ;   et al. | 2013-02-07 |
Systems And Methods For Harvesting Target Particles Of A Suspension App 20120258531 - Seubert; Ronald C. ;   et al. | 2012-10-11 |
Tube And Float Systems For Density-based Fluid Separation App 20120225766 - Seubert; Ronald C. ;   et al. | 2012-09-06 |
Method And System For Cell Filtration App 20120129252 - Seubert; Ronald C. | 2012-05-24 |
Wafer Probe Test And Inspection System App 20110037492 - Seubert; Ronald C. ;   et al. | 2011-02-17 |
Method of making probe cards Grant 5,060,371 - Stewart , et al. October 29, 1 | 1991-10-29 |
Method and apparatus for inspecting integrated circuit probe cards Grant 4,918,374 - Stewart , et al. April 17, 1 | 1990-04-17 |
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