SERIKAWA; Shigeru

Patent Applications and Registrations

Patent applications and USPTO patent grants for SERIKAWA; Shigeru.The latest application filed is for "magnetic disk inspection device and magnetic disk inspection method".

Company Profile

0.11.24

SERIKAWA; Shigeru - Kamisato JP
SERIKAWA; Shigeru - Kamisato-machi JP
Serikawa; Shigeru - Chigasaki N/A JP
Serikawa; Shigeru - Nakai JP
SERIKAWA; Shigeru - Ashigarakami-gun JP
SERIKAWA; Shigeru - Kanagawa JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Magnetic Disk Inspection Device And Magnetic Disk Inspection Method App 20160216216 - SERIKAWA; Shigeru ; et al.	2016-07-28
Optical inspection method and its apparatus Grant 8,781,758 - Serikawa , et al. July 15, 2	2014-07-15
Optical Surface Defect Inspection Apparatus And Optical Surface Defect Inspection Method App 20140071442 - SERIKAWA; Shigeru ; et al.	2014-03-13
Surface Inspecting Apparatus Having Double Recipe Processing Function App 20140043603 - YANAKA; Yu ; et al.	2014-02-13
Method for defect determination in fine concave-convex pattern and method for defect determination on patterned medium Grant 8,638,430 - Sasazawa , et al. January 28, 2	2014-01-28
Optical Surface Defect Inspection Apparatus And Optical Surface Defect Inspection Method App 20130286386 - SERIKAWA; Shigeru ; et al.	2013-10-31
Disk Surface Inspection Method And Disk Surface Inspection Device App 20130258328 - SUGIMOTO; Nobuyuki ; et al.	2013-10-03
Method And Apparatus For Inspecting Surface Of A Sample App 20130258327 - KUSAKA; Yu ; et al.	2013-10-03
Scatterometry method and device for inspecting patterned medium Grant 8,411,928 - Sasazawa , et al. April 2, 2	2013-04-02
Substrate Surface Defect Inspection Method And Inspection Device App 20130077092 - SASAZAWA; Hideaki ; et al.	2013-03-28
Inspection Method And Device For Same App 20120320367 - Yanaka; Yu ; et al.	2012-12-20
Pattern Inspection Method And Device For Same App 20120287426 - Sasazawa; Hideaki ; et al.	2012-11-15
Disk surface inspection apparatus, inspection system thereof, and inspection method thereof Grant 8,253,935 - Hariyama , et al. August 28, 2	2012-08-28
Optical Inspection Method And Its Apparatus App 20120046885 - SERIKAWA; Shigeru ; et al.	2012-02-23
Pattern Shape Inspection Instrument And Pattern Shape Inspection Method, Instrument For Inspecting Stamper For Patterned Media And Method Of Inspecting Stamper For Patterned Media, And Patterned Media Disk Manufacturing Line App 20110272096 - SERIKAWA; Shigeru ; et al.	2011-11-10
Surface defect inspecting apparatus with defect detection optical system and defect-detected image processing Grant 8,018,585 - Hariyama , et al. September 13, 2	2011-09-13
Method and device for detecting shape of surface of medium Grant 7,969,567 - Yoshida , et al. June 28, 2	2011-06-28
Method and apparatus for detecting defects on a disk surface Grant 7,898,652 - Hariyama , et al. March 1, 2	2011-03-01
Method For Defect Determination In Fine Concave-convex Pattern And Method For Defect Determination On Patterned Medium App 20110001962 - Sasazawa; Hideaki ; et al.	2011-01-06
Disk Surface Defect Inspection Method And Apparatus App 20100246356 - FARIZ; Bin Abdulrashid ; et al.	2010-09-30
Disk Surface Inspection Apparatus, Inspection System Thereof, And Inspection Method Thereof App 20100201975 - HARIYAMA; Tatsuo ; et al.	2010-08-12
Method And Device For Inspecting Patterned Medium App 20100098320 - SASAZAWA; Hideaki ; et al.	2010-04-22
Method And Device For Detecting Shape Of Surface Of Medium App 20100085855 - YOSHIDA; Minoru ; et al.	2010-04-08
Method and apparatus for measuring heterodyne optical interference utilizing adjustable polarizing plate Grant 7,612,888 - Serikawa November 3, 2	2009-11-03
Surface Defect Inspecting Apparatus With Defect Detection Optical System And Defect-detected Image Processing App 20090237669 - HARIYAMA; Tatsuo ; et al.	2009-09-24
Method And Apparatus For Detecting Defects On A Disk Surface App 20090190123 - HARIYAMA; Tatsuo ; et al.	2009-07-30
Method And Apparatus For Inspecting A Surface Of A Specimen App 20080239904 - YOSHIDA; Minoru ; et al.	2008-10-02
Optical System Of Detecting Peripheral Surface Defect Of Glass Disk And Device Of Detecting Peripheral Surface Defect Thereof App 20080088830 - SERIKAWA; Shigeru ; et al.	2008-04-17
Detection Method Of Peripheral Surface Defect Of Disk And Detection Device Thereof App 20080080346 - SERIKAWA; Shigeru ; et al.	2008-04-03
Testing Method For Surface Defects On Disc And Testing Apparatus For The Same App 20070222975 - SERIKAWA; SHIGERU ; et al.	2007-09-27
Measuring Method Of Optical Heterodyne Interference And A Measuring Apparatus Thereof App 20070206198 - Serikawa; Shigeru	2007-09-06

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