| Patent | Date |
|---|
Semiconductor device and reading method thereof
Grant 11,423,998 - Senoo August 23, 2 | 2022-08-23 |
Semiconductor Apparatus And Continuous Readout Method
App 20220246217 - Sudo; Naoaki ; et al. | 2022-08-04 |
Semiconductor device and continuous reading method
Grant 11,315,640 - Senoo , et al. April 26, 2 | 2022-04-26 |
Semiconductor Device And Reading Method
App 20220044712 - Okabe; Sho ; et al. | 2022-02-10 |
Semiconductor Device And Reading Method Thereof
App 20210375367 - SENOO; Makoto | 2021-12-02 |
Semiconductor Device And Reading Method Thereof
App 20210366561 - SENOO; Makoto | 2021-11-25 |
Semiconductor Apparatus And Readout Method
App 20210326267 - Okabe; Sho ; et al. | 2021-10-21 |
Semiconductor Storing Apparatus And Readout Method
App 20210311826 - Senoo; Makoto | 2021-10-07 |
Semiconductor Device And Continuous Reading Method
App 20210034304 - Senoo; Makoto ; et al. | 2021-02-04 |
Semiconductor Device And Continuous Reading Method
App 20210035647 - Senoo; Makoto ; et al. | 2021-02-04 |
Semiconductor memory device and operation setting method thereof
Grant 10,817,189 - Murakami , et al. October 27, 2 | 2020-10-27 |
Semiconductor memory device and methods for operating a semiconductor memory device
Grant 10,665,304 - Senoo , et al. | 2020-05-26 |
Semiconductor storage device, operating method thereof and analysis system
Grant 10,641,825 - Senoo , et al. | 2020-05-05 |
Semiconductor memory device for improving high temperature data retention
Grant 10,643,712 - Senoo , et al. | 2020-05-05 |
Semiconductor storage device and readout method thereof
Grant 10,510,421 - Yamauchi , et al. Dec | 2019-12-17 |
Semiconductor Memory Device And Methods For Operating A Semiconductor Memory Device
App 20190237148 - SENOO; Makoto ; et al. | 2019-08-01 |
Semiconductor Storage Device, Operating Method Thereof And Analysis System
App 20190227123 - Senoo; Makoto ; et al. | 2019-07-25 |
Semiconductor Memory Device For Improving High Temperature Data Retention
App 20190221268 - Senoo; Makoto ; et al. | 2019-07-18 |
Semiconductor memory device for improving high temperature data retention
Grant 10,304,543 - Senoo , et al. | 2019-05-28 |
Semiconductor Storage Device And Readout Method Thereof
App 20190156899 - Yamauchi; Kazuki ; et al. | 2019-05-23 |
Semiconductor memory device
Grant 10,297,295 - Murakami , et al. | 2019-05-21 |
Semiconductor device including a voltage generation circuit, and voltage generation circuit generates a required voltage according to internal data requested in response to an operation
Grant 10,096,369 - Murakami , et al. October 9, 2 | 2018-10-09 |
Non-volatile semiconductor memory device
Grant 10,032,512 - Senoo , et al. July 24, 2 | 2018-07-24 |
Semiconductor Memory Device And Operation Setting Method Thereof
App 20180165025 - MURAKAMI; Hiroki ; et al. | 2018-06-14 |
Semiconductor Memory Device
App 20180061496 - Senoo; Makoto ; et al. | 2018-03-01 |
Non-volatile Semiconductor Memory Device
App 20180012655 - Senoo; Makoto ; et al. | 2018-01-11 |
Semiconductor Device
App 20170365351 - Murakami; Hiroki ; et al. | 2017-12-21 |
Semiconductor memory device
Grant 9,613,703 - Senoo April 4, 2 | 2017-04-04 |
Semiconductor memory device and erasing method
Grant 9,214,241 - Senoo December 15, 2 | 2015-12-15 |
Nonvolatile semiconductor memory device and write-in method thereof
Grant 9,064,580 - Senoo , et al. June 23, 2 | 2015-06-23 |
Semiconductor Memory Device
App 20150117104 - Senoo; Makoto | 2015-04-30 |
Semiconductor Memory Device And Erasing Method
App 20150092491 - Senoo; Makoto | 2015-04-02 |
Nonvolatile Semiconductor Memory Device And Write-in Method Thereof
App 20130176783 - SENOO; Makoto ; et al. | 2013-07-11 |
Eddy current flaw detection probe
Grant 8,228,058 - Nishimizu , et al. July 24, 2 | 2012-07-24 |
Semiconductor memory device and method of verifying the same
Grant 7,593,266 - Senoo , et al. September 22, 2 | 2009-09-22 |
Eddy Current Flaw Detection Probe
App 20090009162 - NISHIMIZU; Akira ; et al. | 2009-01-08 |
Semiconductor memory device and method of verifying the same
App 20080123428 - Senoo; Makoto ; et al. | 2008-05-29 |
Ultrasonic array sensor, ultrasonic inspection instrument and ultrasonic inspection method
Grant 6,957,583 - Tooma , et al. October 25, 2 | 2005-10-25 |
Ultrasonic array sensor, ultrasonic inspection instrument and ultrasonic inspection method
App 20040118210 - Tooma, Masahiro ; et al. | 2004-06-24 |
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